检测和替换:基于 FPGA 的 CNN 加速器的高效软错误保护

IF 2.8 2区 工程技术 Q2 COMPUTER SCIENCE, HARDWARE & ARCHITECTURE IEEE Transactions on Very Large Scale Integration (VLSI) Systems Pub Date : 2024-08-26 DOI:10.1109/TVLSI.2024.3443834
Zhen Gao;Yanmao Qi;Jinchang Shi;Qiang Liu;Guangjun Ge;Yu Wang;Pedro Reviriego
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引用次数: 0

摘要

卷积神经网络(cnn)广泛应用于计算机视觉和自然语言处理。现场可编程门阵列(fpga)是一种流行的cnn加速器。然而,fpga容易出现软错误,因此基于fpga的cnn在应用于安全关键应用时的可靠性成为一个关键问题。基于处理单元阵列的卷积模块是加速器中最复杂的部分,是实现高效保护的关键。为了有效地保护卷积模块,提出了基于编码的方案,其中PE阵列的处理建模为并行矩阵向量乘法(MVMs),并且每个错误输出都可以并发检测和纠正。然而,这些模式不能处理配置内存中的错误,这些错误会影响许多中间结果。本文提出了一种基于故障PE检测和替换(DR)的配置内存错误保护方案。在基于Xilinx Zynq 7000 SoC的CNN加速器上实现了该方案,并进行了故障注入(FI)实验来评估该方案的性能。结果表明,与未保护的PE阵列相比,它可以有效地减轻配置内存中的软错误的影响,其复杂性开销约为1.3倍,功耗约为1.4倍。与高级CoC (checksum of checksum)方案相比,容灾方案的功耗可降低30%。
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Detect and Replace: Efficient Soft Error Protection of FPGA-Based CNN Accelerators
Convolutional neural networks (CNNs) are widely used in computer vision and natural language processing. Field-programmable gate arrays (FPGAs) are a popular accelerator for CNNs. However, FPGAs are prone to suffer soft errors, so the reliability of FPGA-based CNNs becomes a key problem when used in safety-critical applications. The convolution module based on a processing element (PE) array is the most complex part of the accelerator, so it is the key to efficient protection. Coding-based schemes have been proposed for efficient protection of the convolution module, where the processing of the PE array is modeled as parallel matrix-vector multiplications (MVMs), and every wrong output would be concurrently detected and corrected. However, these schemes cannot deal with errors in the configuration memory that affects many intermediate results. In this article, a protection scheme is proposed based on faulty PE detection and replace (DR) to deal with such configuration memory errors. The DR scheme is implemented on a CNN accelerator based on Xilinx Zynq 7000 SoC, and fault injection (FI) experiments are performed to evaluate the performance of the proposed DR scheme. The results show that it can effectively mitigate the effect of soft errors in the configuration memory with an overhead of about 1.3 times complexity and 1.4 times power consumption relative to those of the unprotected PE array. Compared with the advanced checksum-of-checksum (CoC) scheme, the DR scheme decreases power consumption by up to 30%.
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来源期刊
CiteScore
6.40
自引率
7.10%
发文量
187
审稿时长
3.6 months
期刊介绍: The IEEE Transactions on VLSI Systems is published as a monthly journal under the co-sponsorship of the IEEE Circuits and Systems Society, the IEEE Computer Society, and the IEEE Solid-State Circuits Society. Design and realization of microelectronic systems using VLSI/ULSI technologies require close collaboration among scientists and engineers in the fields of systems architecture, logic and circuit design, chips and wafer fabrication, packaging, testing and systems applications. Generation of specifications, design and verification must be performed at all abstraction levels, including the system, register-transfer, logic, circuit, transistor and process levels. To address this critical area through a common forum, the IEEE Transactions on VLSI Systems have been founded. The editorial board, consisting of international experts, invites original papers which emphasize and merit the novel systems integration aspects of microelectronic systems including interactions among systems design and partitioning, logic and memory design, digital and analog circuit design, layout synthesis, CAD tools, chips and wafer fabrication, testing and packaging, and systems level qualification. Thus, the coverage of these Transactions will focus on VLSI/ULSI microelectronic systems integration.
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