通过扫描金涂层硅套管中的光纤探针进行多通道 SPR 测量

IF 4.1 1区 工程技术 Q2 ENGINEERING, ELECTRICAL & ELECTRONIC Journal of Lightwave Technology Pub Date : 2024-09-03 DOI:10.1109/jlt.2024.3453278
Zhiyong Yang, Wanjun Li, Yongguang Xiao, Jiwei Xie, Xiangyu Yan, Daotong You, Tuan Guo, Kaiwei Li
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Multi-channel SPR Measurement by Scanning a Fiber-Optic Probe in a Gold-coated Silica Sleeve
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来源期刊
Journal of Lightwave Technology
Journal of Lightwave Technology 工程技术-工程:电子与电气
CiteScore
9.40
自引率
14.90%
发文量
936
审稿时长
3.9 months
期刊介绍: The Journal of Lightwave Technology is comprised of original contributions, both regular papers and letters, covering work in all aspects of optical guided-wave science, technology, and engineering. Manuscripts are solicited which report original theoretical and/or experimental results which advance the technological base of guided-wave technology. Tutorial and review papers are by invitation only. Topics of interest include the following: fiber and cable technologies, active and passive guided-wave componentry (light sources, detectors, repeaters, switches, fiber sensors, etc.); integrated optics and optoelectronics; and systems, subsystems, new applications and unique field trials. System oriented manuscripts should be concerned with systems which perform a function not previously available, out-perform previously established systems, or represent enhancements in the state of the art in general.
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Table of Contents Guest Editorial Guest Editorial for the Special Issue on Microwave Photonics Front Cover Front Cover Front Cover
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