暗场紫外光发射电子显微镜中的磁二色性

arXiv - PHYS - Mesoscale and Nanoscale Physics Pub Date : 2024-09-07 DOI:arxiv-2409.04771

Maximilian Paleschke, David Huber, Friederike Wührl, Cheng-Tien Chiang, Frank O. Schumann, Jürgen Henk, Wolf Widdra

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引用次数: 0

摘要

光发射电子显微镜（PEEM）已发展成为纳米级表面结构和磁性表征不可或缺的工具。基于同步辐射的 X 射线 PEEM 是通过磁环状二色性（MCD）研究特定元素磁性能的主要方法，与此形成鲜明对比的是，实验室紫外 PEEM 的应用非常有限，其对平面内磁化的二色性效应要小得多。在这里，我们引入了暗场 PEEM 作为一种新方法，以增强阈值光发射中的 MCD 对比度，从而实现高效的 MCD 成像，并显著增强了 Fe(001) 的对比度，达到一个数量级。这一进步为利用现代激光器在飞秒时间尺度上进行 MCD 成像铺平了道路。实验结果将以先进的相对论光发射计算为基准进行定量分析。

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Magnetic dichroism in darkfield UV photoemission electron microscopy

Photoemission electron microscopy (PEEM) has evolved into an indispensable tool for structural and magnetic characterization of surfaces at the nanometer scale. In strong contrast to synchrotron-radiation-based X-ray PEEM as a leading method for element-specific magnetic properties via magnetic circular dichroism (MCD), laboratory ultraviolet (UV) PEEM has seen limited application with much smaller dichroism effects for in-plane magnetization. Here we introduce darkfield PEEM as a novel approach to enhance MCD contrast in threshold photoemission, enabling efficient MCD imaging with significantly enhanced contrast by an order-of-magnitude for Fe(001). This advancement paves the way for MCD imaging on femtosecond timescales using modern lasers. The experimental results will be quantitatively benchmarked against advanced relativistic photoemission calculations.

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arXiv - PHYS - Mesoscale and Nanoscale Physics

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