{"title":"基于深度学习的 PCB 缺陷检测算法","authors":"","doi":"10.1016/j.ijleo.2024.172036","DOIUrl":null,"url":null,"abstract":"<div><p>Deep learning gained great popularity in the task of object detection. This paper proposes a printed circuit board (PCB) defect detection algorithm based on deep learning, which can improve product quality and avoid potential failures and accidents in the electronics manufacturing industry. In this paper, the YOLOv7 model is selected as the original model for PCB defect detection. Firstly, the K-means++ clustering algorithm is used to calculate the target anchor parameters which can enhance the dataset. Secondly, the receptive field enhancement (RFE) module is added to the head layer of the network to take full advantage of the receptive field in the feature map. Thirdly, the loss function CIoU of the YOLOv7 model is changed to WIoUv2. Fourthly, add the Triplet attention mechanism to the CBS and SPPCSPC modules. Finally, the detection accuracy of the improved YOLOv7 model is compared with that of Faster R-CNN, SSD, YOLOv3-tiny, YOLOv5s, and YOLOv7 models. The experimental results show that the detection accuracy and detection speed of the improved YOLOv7 model are enhanced compared with the original YOLOv7 model.</p></div>","PeriodicalId":19513,"journal":{"name":"Optik","volume":null,"pages":null},"PeriodicalIF":3.1000,"publicationDate":"2024-09-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"PCB defect detection algorithm based on deep learning\",\"authors\":\"\",\"doi\":\"10.1016/j.ijleo.2024.172036\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><p>Deep learning gained great popularity in the task of object detection. This paper proposes a printed circuit board (PCB) defect detection algorithm based on deep learning, which can improve product quality and avoid potential failures and accidents in the electronics manufacturing industry. In this paper, the YOLOv7 model is selected as the original model for PCB defect detection. Firstly, the K-means++ clustering algorithm is used to calculate the target anchor parameters which can enhance the dataset. Secondly, the receptive field enhancement (RFE) module is added to the head layer of the network to take full advantage of the receptive field in the feature map. Thirdly, the loss function CIoU of the YOLOv7 model is changed to WIoUv2. Fourthly, add the Triplet attention mechanism to the CBS and SPPCSPC modules. Finally, the detection accuracy of the improved YOLOv7 model is compared with that of Faster R-CNN, SSD, YOLOv3-tiny, YOLOv5s, and YOLOv7 models. The experimental results show that the detection accuracy and detection speed of the improved YOLOv7 model are enhanced compared with the original YOLOv7 model.</p></div>\",\"PeriodicalId\":19513,\"journal\":{\"name\":\"Optik\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":3.1000,\"publicationDate\":\"2024-09-10\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Optik\",\"FirstCategoryId\":\"101\",\"ListUrlMain\":\"https://www.sciencedirect.com/science/article/pii/S0030402624004352\",\"RegionNum\":3,\"RegionCategory\":\"物理与天体物理\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q2\",\"JCRName\":\"Engineering\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Optik","FirstCategoryId":"101","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0030402624004352","RegionNum":3,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"Engineering","Score":null,"Total":0}
PCB defect detection algorithm based on deep learning
Deep learning gained great popularity in the task of object detection. This paper proposes a printed circuit board (PCB) defect detection algorithm based on deep learning, which can improve product quality and avoid potential failures and accidents in the electronics manufacturing industry. In this paper, the YOLOv7 model is selected as the original model for PCB defect detection. Firstly, the K-means++ clustering algorithm is used to calculate the target anchor parameters which can enhance the dataset. Secondly, the receptive field enhancement (RFE) module is added to the head layer of the network to take full advantage of the receptive field in the feature map. Thirdly, the loss function CIoU of the YOLOv7 model is changed to WIoUv2. Fourthly, add the Triplet attention mechanism to the CBS and SPPCSPC modules. Finally, the detection accuracy of the improved YOLOv7 model is compared with that of Faster R-CNN, SSD, YOLOv3-tiny, YOLOv5s, and YOLOv7 models. The experimental results show that the detection accuracy and detection speed of the improved YOLOv7 model are enhanced compared with the original YOLOv7 model.
期刊介绍:
Optik publishes articles on all subjects related to light and electron optics and offers a survey on the state of research and technical development within the following fields:
Optics:
-Optics design, geometrical and beam optics, wave optics-
Optical and micro-optical components, diffractive optics, devices and systems-
Photoelectric and optoelectronic devices-
Optical properties of materials, nonlinear optics, wave propagation and transmission in homogeneous and inhomogeneous materials-
Information optics, image formation and processing, holographic techniques, microscopes and spectrometer techniques, and image analysis-
Optical testing and measuring techniques-
Optical communication and computing-
Physiological optics-
As well as other related topics.