Shuidan Qin;Bing Xing Wang;Xiaofei Wang;Junhao Liu
{"title":"基于系统加速寿命测试数据的指数分担系统可靠性评估","authors":"Shuidan Qin;Bing Xing Wang;Xiaofei Wang;Junhao Liu","doi":"10.1109/TR.2024.3455380","DOIUrl":null,"url":null,"abstract":"In this article, the reliability assessment methods for the exponential load-sharing system is proposed based on the system accelerated life testing data under the equal load-sharing rule. The exponential distribution is used to model the baseline distributions of the component lifetimes in load-sharing systems. The relationship between the load levels and the component lifetimes is assumed to be log-linear. Accurate confidence intervals for the model parameters, system reliability and mean lifetime at the initial stress level are proposed. The prediction intervals are also derived for the future failure time and the remaining useful life of the system at the initial stress level. The performance of the proposed procedures is evaluated by using Monte Carlo simulation. The simulation results show that the proposed procedures outperform the large sample normal approximation method in terms of the coverage probability and average interval length, in particular for small sample sizes. Finally, a numerical example is used to illustrate the developed procedures.","PeriodicalId":56305,"journal":{"name":"IEEE Transactions on Reliability","volume":"74 3","pages":"3126-3136"},"PeriodicalIF":5.7000,"publicationDate":"2024-09-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Reliability Evaluation for the Exponential Load-Sharing System Based on System Accelerated Life Testing Data\",\"authors\":\"Shuidan Qin;Bing Xing Wang;Xiaofei Wang;Junhao Liu\",\"doi\":\"10.1109/TR.2024.3455380\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this article, the reliability assessment methods for the exponential load-sharing system is proposed based on the system accelerated life testing data under the equal load-sharing rule. The exponential distribution is used to model the baseline distributions of the component lifetimes in load-sharing systems. The relationship between the load levels and the component lifetimes is assumed to be log-linear. Accurate confidence intervals for the model parameters, system reliability and mean lifetime at the initial stress level are proposed. The prediction intervals are also derived for the future failure time and the remaining useful life of the system at the initial stress level. The performance of the proposed procedures is evaluated by using Monte Carlo simulation. The simulation results show that the proposed procedures outperform the large sample normal approximation method in terms of the coverage probability and average interval length, in particular for small sample sizes. Finally, a numerical example is used to illustrate the developed procedures.\",\"PeriodicalId\":56305,\"journal\":{\"name\":\"IEEE Transactions on Reliability\",\"volume\":\"74 3\",\"pages\":\"3126-3136\"},\"PeriodicalIF\":5.7000,\"publicationDate\":\"2024-09-16\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE Transactions on Reliability\",\"FirstCategoryId\":\"94\",\"ListUrlMain\":\"https://ieeexplore.ieee.org/document/10681235/\",\"RegionNum\":2,\"RegionCategory\":\"计算机科学\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q1\",\"JCRName\":\"COMPUTER SCIENCE, HARDWARE & ARCHITECTURE\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Reliability","FirstCategoryId":"94","ListUrlMain":"https://ieeexplore.ieee.org/document/10681235/","RegionNum":2,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"COMPUTER SCIENCE, HARDWARE & ARCHITECTURE","Score":null,"Total":0}
Reliability Evaluation for the Exponential Load-Sharing System Based on System Accelerated Life Testing Data
In this article, the reliability assessment methods for the exponential load-sharing system is proposed based on the system accelerated life testing data under the equal load-sharing rule. The exponential distribution is used to model the baseline distributions of the component lifetimes in load-sharing systems. The relationship between the load levels and the component lifetimes is assumed to be log-linear. Accurate confidence intervals for the model parameters, system reliability and mean lifetime at the initial stress level are proposed. The prediction intervals are also derived for the future failure time and the remaining useful life of the system at the initial stress level. The performance of the proposed procedures is evaluated by using Monte Carlo simulation. The simulation results show that the proposed procedures outperform the large sample normal approximation method in terms of the coverage probability and average interval length, in particular for small sample sizes. Finally, a numerical example is used to illustrate the developed procedures.
期刊介绍:
IEEE Transactions on Reliability is a refereed journal for the reliability and allied disciplines including, but not limited to, maintainability, physics of failure, life testing, prognostics, design and manufacture for reliability, reliability for systems of systems, network availability, mission success, warranty, safety, and various measures of effectiveness. Topics eligible for publication range from hardware to software, from materials to systems, from consumer and industrial devices to manufacturing plants, from individual items to networks, from techniques for making things better to ways of predicting and measuring behavior in the field. As an engineering subject that supports new and existing technologies, we constantly expand into new areas of the assurance sciences.