Johannes Hoffmann, Sophie de Preville, Bruno Eckmann, Hung-Ju Lin, Benedikt Herzog, Kamel Haddadi, Didier Theron, Georg Gramse, Damien Richert, Jose Moran-Meza, Francois Piquemal
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引用次数: 0
摘要
本文给出了用于扫描微波显微镜的阻抗匹配网络的增益和附加噪声的定义。该定义可用于比较不同的阻抗匹配技术，而与用于测量 S 参数的仪器无关。作为演示，我们研究了由比特线、调谐器和带或不带放大器的干涉测量装置组成的阻抗匹配设备。测量频率高达 28 千兆赫，结果发现最大增益为每西门子 9504.7。
Comparison of Impedance Matching Networks for Scanning Microwave Microscopy
In this paper, a definition of the gain and added noise of impedance matching
networks for scanning microwave microscopy is given. This definition can be
used to compare different impedance matching techniques independently of the
instrument used to measure the S-parameter. As a demonstration, impedance
matching devices consisting of a Beatty line, a tuner, and interferometric
setups with and without amplifiers have been investigated. Measurement
frequencies up to 28 GHz are used, and the maximal resulting gain found was
9504.7 per Siemens.
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