4D 相机:用于扫描/透射电子显微镜的 87 kHz 直接电子探测器。

IF 2.9 4区 工程技术 Q3 MATERIALS SCIENCE, MULTIDISCIPLINARY Microscopy and Microanalysis Pub Date : 2024-09-19 DOI:10.1093/mam/ozae086
Peter Ercius, Ian J Johnson, Philipp Pelz, Benjamin H Savitzky, Lauren Hughes, Hamish G Brown, Steven E Zeltmann, Shang-Lin Hsu, Cassio C S Pedroso, Bruce E Cohen, Ramamoorthy Ramesh, David Paul, John M Joseph, Thorsten Stezelberger, Cory Czarnik, Matthew Lent, Erin Fong, Jim Ciston, Mary C Scott, Colin Ophus, Andrew M Minor, Peter Denes
{"title":"4D 相机:用于扫描/透射电子显微镜的 87 kHz 直接电子探测器。","authors":"Peter Ercius, Ian J Johnson, Philipp Pelz, Benjamin H Savitzky, Lauren Hughes, Hamish G Brown, Steven E Zeltmann, Shang-Lin Hsu, Cassio C S Pedroso, Bruce E Cohen, Ramamoorthy Ramesh, David Paul, John M Joseph, Thorsten Stezelberger, Cory Czarnik, Matthew Lent, Erin Fong, Jim Ciston, Mary C Scott, Colin Ophus, Andrew M Minor, Peter Denes","doi":"10.1093/mam/ozae086","DOIUrl":null,"url":null,"abstract":"<p><p>We describe the development, operation, and application of the 4D Camera-a 576 by 576 pixel active pixel sensor for scanning/transmission electron microscopy which operates at 87,000 Hz. The detector generates data at ∼480 Gbit/s which is captured by dedicated receiver computers with a parallelized software infrastructure that has been implemented to process the resulting 10-700 Gigabyte-sized raw datasets. The back illuminated detector provides the ability to detect single electron events at accelerating voltages from 30 to 300 kV. Through electron counting, the resulting sparse data sets are reduced in size by 10--300× compared to the raw data, and open-source sparsity-based processing algorithms offer rapid data analysis. The high frame rate allows for large and complex scanning diffraction experiments to be accomplished with typical scanning transmission electron microscopy scanning parameters.</p>","PeriodicalId":18625,"journal":{"name":"Microscopy and Microanalysis","volume":null,"pages":null},"PeriodicalIF":2.9000,"publicationDate":"2024-09-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"The 4D Camera: An 87 kHz Direct Electron Detector for Scanning/Transmission Electron Microscopy.\",\"authors\":\"Peter Ercius, Ian J Johnson, Philipp Pelz, Benjamin H Savitzky, Lauren Hughes, Hamish G Brown, Steven E Zeltmann, Shang-Lin Hsu, Cassio C S Pedroso, Bruce E Cohen, Ramamoorthy Ramesh, David Paul, John M Joseph, Thorsten Stezelberger, Cory Czarnik, Matthew Lent, Erin Fong, Jim Ciston, Mary C Scott, Colin Ophus, Andrew M Minor, Peter Denes\",\"doi\":\"10.1093/mam/ozae086\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<p><p>We describe the development, operation, and application of the 4D Camera-a 576 by 576 pixel active pixel sensor for scanning/transmission electron microscopy which operates at 87,000 Hz. The detector generates data at ∼480 Gbit/s which is captured by dedicated receiver computers with a parallelized software infrastructure that has been implemented to process the resulting 10-700 Gigabyte-sized raw datasets. The back illuminated detector provides the ability to detect single electron events at accelerating voltages from 30 to 300 kV. Through electron counting, the resulting sparse data sets are reduced in size by 10--300× compared to the raw data, and open-source sparsity-based processing algorithms offer rapid data analysis. The high frame rate allows for large and complex scanning diffraction experiments to be accomplished with typical scanning transmission electron microscopy scanning parameters.</p>\",\"PeriodicalId\":18625,\"journal\":{\"name\":\"Microscopy and Microanalysis\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":2.9000,\"publicationDate\":\"2024-09-19\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Microscopy and Microanalysis\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://doi.org/10.1093/mam/ozae086\",\"RegionNum\":4,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q3\",\"JCRName\":\"MATERIALS SCIENCE, MULTIDISCIPLINARY\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Microscopy and Microanalysis","FirstCategoryId":"5","ListUrlMain":"https://doi.org/10.1093/mam/ozae086","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"MATERIALS SCIENCE, MULTIDISCIPLINARY","Score":null,"Total":0}
引用次数: 0

摘要

我们介绍了 4D 相机的开发、运行和应用情况--这是一种用于扫描/透射电子显微镜的 576 x 576 像素有源像素传感器,工作频率为 87,000 Hz。探测器以 ∼480 Gbit/s 的速度生成数据,由专用接收计算机捕获,并通过并行化软件基础设施对生成的 10-700 千兆字节大小的原始数据集进行处理。背照式探测器能够在 30 至 300 千伏的加速电压下探测单个电子事件。通过电子计数,稀疏数据集的大小比原始数据缩小了10-300倍,基于稀疏性的开源处理算法可提供快速的数据分析。高帧频允许使用典型的扫描透射电子显微镜扫描参数完成大型复杂的扫描衍射实验。
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The 4D Camera: An 87 kHz Direct Electron Detector for Scanning/Transmission Electron Microscopy.

We describe the development, operation, and application of the 4D Camera-a 576 by 576 pixel active pixel sensor for scanning/transmission electron microscopy which operates at 87,000 Hz. The detector generates data at ∼480 Gbit/s which is captured by dedicated receiver computers with a parallelized software infrastructure that has been implemented to process the resulting 10-700 Gigabyte-sized raw datasets. The back illuminated detector provides the ability to detect single electron events at accelerating voltages from 30 to 300 kV. Through electron counting, the resulting sparse data sets are reduced in size by 10--300× compared to the raw data, and open-source sparsity-based processing algorithms offer rapid data analysis. The high frame rate allows for large and complex scanning diffraction experiments to be accomplished with typical scanning transmission electron microscopy scanning parameters.

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来源期刊
Microscopy and Microanalysis
Microscopy and Microanalysis 工程技术-材料科学:综合
CiteScore
1.10
自引率
10.70%
发文量
1391
审稿时长
6 months
期刊介绍: Microscopy and Microanalysis publishes original research papers in the fields of microscopy, imaging, and compositional analysis. This distinguished international forum is intended for microscopists in both biology and materials science. The journal provides significant articles that describe new and existing techniques and instrumentation, as well as the applications of these to the imaging and analysis of microstructure. Microscopy and Microanalysis also includes review articles, letters to the editor, and book reviews.
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