{"title":"通过缝合刻度条方法改进长测试长度:激光跟踪仪的中期测试。","authors":"Vincent D Lee, Daniel Sawyer, Bala Muralikrishnan","doi":"10.6028/jres.125.016","DOIUrl":null,"url":null,"abstract":"<p><p>Performance verifications of laser tracker systems (LTSs) often rely on calibrated length artifacts that are 2.3 m in length or more, as specified in International Standards Organization (ISO) and American Society of Mechanical Engineers (ASME) standards. The 2.3 m length is chosen as the minimum length that will sufficiently expose inaccuracy in LTSs. Embodiment of these artifacts often comes in the form of scale bars, fixed monuments, or a laser rail. In National Institute of Standards and Technology (NIST) Internal Report (IR) 8016, which was published in 2014 and discusses interim testing of LTSs, it was shown that a scale bar with three nests spaced 1.15 m apart was sufficient for exposing errors in LTSs. In that case, the LTS was placed symmetrically with respect to the scale bar so that both a 2.3 m symmetrical length and a 1.15 m asymmetrical length were presented to the LTS. This paper will evaluate whether a scale bar that is only 1.15 m in length can sufficiently expose errors within the LTS when it is stitched together to create a 2.3 m long test length.</p>","PeriodicalId":54766,"journal":{"name":"Journal of Research of the National Institute of Standards and Technology","volume":"125 ","pages":"125016"},"PeriodicalIF":1.3000,"publicationDate":"2020-05-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC11374359/pdf/","citationCount":"0","resultStr":"{\"title\":\"Improvised Long Test Lengths via Stitching Scale Bar Method: Interim Testing of Laser Trackers.\",\"authors\":\"Vincent D Lee, Daniel Sawyer, Bala Muralikrishnan\",\"doi\":\"10.6028/jres.125.016\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<p><p>Performance verifications of laser tracker systems (LTSs) often rely on calibrated length artifacts that are 2.3 m in length or more, as specified in International Standards Organization (ISO) and American Society of Mechanical Engineers (ASME) standards. The 2.3 m length is chosen as the minimum length that will sufficiently expose inaccuracy in LTSs. Embodiment of these artifacts often comes in the form of scale bars, fixed monuments, or a laser rail. In National Institute of Standards and Technology (NIST) Internal Report (IR) 8016, which was published in 2014 and discusses interim testing of LTSs, it was shown that a scale bar with three nests spaced 1.15 m apart was sufficient for exposing errors in LTSs. In that case, the LTS was placed symmetrically with respect to the scale bar so that both a 2.3 m symmetrical length and a 1.15 m asymmetrical length were presented to the LTS. This paper will evaluate whether a scale bar that is only 1.15 m in length can sufficiently expose errors within the LTS when it is stitched together to create a 2.3 m long test length.</p>\",\"PeriodicalId\":54766,\"journal\":{\"name\":\"Journal of Research of the National Institute of Standards and Technology\",\"volume\":\"125 \",\"pages\":\"125016\"},\"PeriodicalIF\":1.3000,\"publicationDate\":\"2020-05-28\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC11374359/pdf/\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Journal of Research of the National Institute of Standards and Technology\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://doi.org/10.6028/jres.125.016\",\"RegionNum\":4,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"2020/1/1 0:00:00\",\"PubModel\":\"eCollection\",\"JCR\":\"Q3\",\"JCRName\":\"INSTRUMENTS & INSTRUMENTATION\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Research of the National Institute of Standards and Technology","FirstCategoryId":"5","ListUrlMain":"https://doi.org/10.6028/jres.125.016","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"2020/1/1 0:00:00","PubModel":"eCollection","JCR":"Q3","JCRName":"INSTRUMENTS & INSTRUMENTATION","Score":null,"Total":0}
Improvised Long Test Lengths via Stitching Scale Bar Method: Interim Testing of Laser Trackers.
Performance verifications of laser tracker systems (LTSs) often rely on calibrated length artifacts that are 2.3 m in length or more, as specified in International Standards Organization (ISO) and American Society of Mechanical Engineers (ASME) standards. The 2.3 m length is chosen as the minimum length that will sufficiently expose inaccuracy in LTSs. Embodiment of these artifacts often comes in the form of scale bars, fixed monuments, or a laser rail. In National Institute of Standards and Technology (NIST) Internal Report (IR) 8016, which was published in 2014 and discusses interim testing of LTSs, it was shown that a scale bar with three nests spaced 1.15 m apart was sufficient for exposing errors in LTSs. In that case, the LTS was placed symmetrically with respect to the scale bar so that both a 2.3 m symmetrical length and a 1.15 m asymmetrical length were presented to the LTS. This paper will evaluate whether a scale bar that is only 1.15 m in length can sufficiently expose errors within the LTS when it is stitched together to create a 2.3 m long test length.
期刊介绍:
The Journal of Research of the National Institute of Standards and Technology is the flagship publication of the National Institute of Standards and Technology. It has been published under various titles and forms since 1904, with its roots as Scientific Papers issued as the Bulletin of the Bureau of Standards.
In 1928, the Scientific Papers were combined with Technologic Papers, which reported results of investigations of material and methods of testing. This new publication was titled the Bureau of Standards Journal of Research.
The Journal of Research of NIST reports NIST research and development in metrology and related fields of physical science, engineering, applied mathematics, statistics, biotechnology, information technology.