{"title":"利用射频信号监测焊点裂纹扩展的片上传感器:电气建模和电路设计","authors":"Tae Yeob Kang;Yunah Her;Byeongcheol Choe;Gwang-hyeon Jeong","doi":"10.1109/LSENS.2024.3459031","DOIUrl":null,"url":null,"abstract":"This letter presents an on-chip scale crack sensor for solder joints using radio frequency signals, essential for enhancing the reliability of electronic packages. The sensor design includes a Class F power amplifier and an envelope detector, based on an equivalent circuit model of cracked solder joints. Circuit simulations reveal that as a crack initiate, a resonant dip in the S-parameter pattern appears, with the resonant frequency decreasing as the crack propagates. Leveraging the resonant dip as a prognostic factor, the sensor can accurately characterize cracks in solder joints with easy-to-handle dc output. The sensor, which provides a maximum crack length sensitivity of 0.05 GHz/\n<inline-formula><tex-math>$\\upmu$</tex-math></inline-formula>\nm, is highly sensitive and can be fabricated on-chip.","PeriodicalId":13014,"journal":{"name":"IEEE Sensors Letters","volume":"8 10","pages":"1-4"},"PeriodicalIF":2.2000,"publicationDate":"2024-09-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"On-Chip Sensor for Monitoring Crack Propagation in Solder Joints Using RF Signals: Electrical Modeling and Circuit Design\",\"authors\":\"Tae Yeob Kang;Yunah Her;Byeongcheol Choe;Gwang-hyeon Jeong\",\"doi\":\"10.1109/LSENS.2024.3459031\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This letter presents an on-chip scale crack sensor for solder joints using radio frequency signals, essential for enhancing the reliability of electronic packages. The sensor design includes a Class F power amplifier and an envelope detector, based on an equivalent circuit model of cracked solder joints. Circuit simulations reveal that as a crack initiate, a resonant dip in the S-parameter pattern appears, with the resonant frequency decreasing as the crack propagates. Leveraging the resonant dip as a prognostic factor, the sensor can accurately characterize cracks in solder joints with easy-to-handle dc output. The sensor, which provides a maximum crack length sensitivity of 0.05 GHz/\\n<inline-formula><tex-math>$\\\\upmu$</tex-math></inline-formula>\\nm, is highly sensitive and can be fabricated on-chip.\",\"PeriodicalId\":13014,\"journal\":{\"name\":\"IEEE Sensors Letters\",\"volume\":\"8 10\",\"pages\":\"1-4\"},\"PeriodicalIF\":2.2000,\"publicationDate\":\"2024-09-11\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE Sensors Letters\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://ieeexplore.ieee.org/document/10678841/\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q3\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Sensors Letters","FirstCategoryId":"1085","ListUrlMain":"https://ieeexplore.ieee.org/document/10678841/","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
摘要
这封信介绍了一种使用射频信号的片上焊点裂纹传感器,它对提高电子封装的可靠性至关重要。该传感器的设计包括一个 F 类功率放大器和一个包络探测器,均基于裂纹焊点的等效电路模型。电路仿真显示,随着裂纹的产生,S 参数模式中会出现共振凹陷,共振频率会随着裂纹的扩展而降低。利用共振凹陷作为预报因素,传感器可以准确地描述焊点裂纹的特征,并提供易于处理的直流输出。该传感器的最大裂纹长度灵敏度为 0.05 GHz/$\upmu$m,灵敏度高,可在芯片上制造。
On-Chip Sensor for Monitoring Crack Propagation in Solder Joints Using RF Signals: Electrical Modeling and Circuit Design
This letter presents an on-chip scale crack sensor for solder joints using radio frequency signals, essential for enhancing the reliability of electronic packages. The sensor design includes a Class F power amplifier and an envelope detector, based on an equivalent circuit model of cracked solder joints. Circuit simulations reveal that as a crack initiate, a resonant dip in the S-parameter pattern appears, with the resonant frequency decreasing as the crack propagates. Leveraging the resonant dip as a prognostic factor, the sensor can accurately characterize cracks in solder joints with easy-to-handle dc output. The sensor, which provides a maximum crack length sensitivity of 0.05 GHz/
$\upmu$
m, is highly sensitive and can be fabricated on-chip.