K. Tőkési, Z. Li, X. H. Zhou, J. M. Gong, R. G. Zeng, Z. J. Ding
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引用次数: 0
摘要
我们介绍了从测量到的高能量分辨率反射电子能损耗光谱（REELS）光谱中高精度测定电子能量损耗函数，进而测定固体的光学常数 n 和 k，其光谱能量范围涵盖从可见光到真空紫外光。计算基于我们最近开发的反向蒙特卡罗（RMC）方法。RMC 方法将用于 REELS 光谱模拟的电子传输蒙特卡罗建模（包括弹性碰撞和非弹性碰撞）与参数化能量损失函数 Im [-1/ε(ω)] 的马尔可夫链蒙特卡罗计算相结合。我们发现，我们计算出的元素光学数据非常准确地满足了总和规则；因此，强烈建议在材料科学和表面分析中进一步应用这些计算出的光学数据。
Determination of Optical Properties of Solids from Reflection Electron Energy Loss Spectroscopy Spectra
We present high precision determination of electron energy loss functions and thereby the optical constants, n and k, of solids from the measured, high energy resolution reflection electron energy-loss spectroscopy (REELS) spectra, covering the spectral energy range from visible to vacuum ultraviolet. The calculations are based on our recently developed reverse Monte Carlo (RMC) method. The RMC method combines a Monte Carlo modelling of electron transportation for REELS spectrum simulation, including both the elastic and inelastic collisions, with a Markov chain Monte Carlo calculation of parameterized energy loss function, Im [–1/ε(ω)]. We found that our calculated optical data of elements fulfill the sum rules with very high accuracy; therefore, the use of this calculated optical data in material science and surface analysis is highly recommended for further applications.
期刊介绍：
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques publishes original articles on the topical problems of solid-state physics, materials science, experimental techniques, condensed media, nanostructures, surfaces of thin films, and phase boundaries: geometric and energetical structures of surfaces, the methods of computer simulations; physical and chemical properties and their changes upon radiation and other treatments; the methods of studies of films and surface layers of crystals (XRD, XPS, synchrotron radiation, neutron and electron diffraction, electron microscopic, scanning tunneling microscopic, atomic force microscopic studies, and other methods that provide data on the surfaces and thin films). Articles related to the methods and technics of structure studies are the focus of the journal. The journal accepts manuscripts of regular articles and reviews in English or Russian language from authors of all countries. All manuscripts are peer-reviewed.
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