C60 富勒烯在同素异形聚丙烯基质中聚合的拓扑缺陷

L. V. Elnikova, A. N. Ozerin, V. G. Shevchenko, P. M. Nedorezova, O. M. Palaznik, A. T. Ponomarenko, V. V. Skoi, A. I. Kuklin
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引用次数: 0

摘要

根据富勒烯 C60(16.5 wt %)在同素异形聚丙烯基体中组成的纳米复合材料的小角中子散射数据,我们获得了纳米颗粒聚合的信息,并确定了它们的几何参数和尺寸。本研究对小角中子散射实验中观察到的具有表面分形特性的颗粒聚集提出了解释,其尺寸范围可达 80 纳米。基于非欧几里得度量中富勒烯 C60 分子缺陷结构的著名理论,特别是哥德尔型二维球形空间中的披露和单极,我们提出了单极气体模型的晶格版本。在此框架内,我们在具有阿贝尔投影的晶格上使用蒙特卡洛方法估算了不同单极子浓度下的单极子电流能量。利用所提出的模型,我们可以计算聚合物复合材料中 C60 纳米粒子的分形特性,并解释披露的演变过程。
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Topological Defects in the Aggregation of C60 Fullerene in an Isotactic Polypropylene Matrix

Based on small angle neutron-scattering data from a nanocomposite composed of fullerene C60 (16.5 wt %) in an isotactic polypropylene matrix, we receive information on the clusterization of nanoparticles and define their geometric parameters and dimensionality. This study proposes an interpretation of the aggregation of particles with surface fractal properties in the size range up to 80 nm, as observed in a small-angle-neutron-scattering experiment. Based on well-known theories about the defect structure of the fullerene C60 molecule in non-Euclidean metrics, specifically disclinations and monopoles in the two-dimensional spherical space of Gödel type, we formulate a lattice version of the monopole gas model. Within this framework, we use the Monte Carlo method on a lattice with the Abelian projection to estimate the energies of monopole currents at various monopole concentrations. The proposed model enables the calculation of the fractal properties of C60 nanoparticles in a polymer composite, as well as the interpretation of the evolution of disclinations.

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来源期刊
CiteScore
0.90
自引率
25.00%
发文量
144
审稿时长
3-8 weeks
期刊介绍: Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques publishes original articles on the topical problems of solid-state physics, materials science, experimental techniques, condensed media, nanostructures, surfaces of thin films, and phase boundaries: geometric and energetical structures of surfaces, the methods of computer simulations; physical and chemical properties and their changes upon radiation and other treatments; the methods of studies of films and surface layers of crystals (XRD, XPS, synchrotron radiation, neutron and electron diffraction, electron microscopic, scanning tunneling microscopic, atomic force microscopic studies, and other methods that provide data on the surfaces and thin films). Articles related to the methods and technics of structure studies are the focus of the journal. The journal accepts manuscripts of regular articles and reviews in English or Russian language from authors of all countries. All manuscripts are peer-reviewed.
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