M. M. Tatevosyan, V. G. Vlasenko, A. A. Shiryaeva, T. N. Zhukova
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The quantitative characteristics of the parameters of the chemical interaction of atoms, such as population, natural charges, and electronic configurations in the studied polymers, are obtained on the basis of analysis of hybrid natural bond orbitals. The values of the polarization coefficients of natural bond orbitals indicate the localization of electron density predominantly on carbon atoms. The electronic configurations for carbon atoms in different fragments differ significantly. For the C atoms of ethynyl (diethynyl) fragments, they are close to the linear σ bond of the <i>sp</i><sup>1.03</sup> (<i>P</i>1) and <i>sp</i><sup>0.95</sup> (<i>P</i>2) type, while for the C atoms of phenyl fragments, they are <i>sp</i><sup>2.42</sup>, which are intermediate between <i>sp</i><sup>2</sup> and <i>sp</i><sup>3</sup>, in accordance with molecular geometry. The natural charges on Si in both polymers are almost the same: +1.58<i>e</i>, +1.59<i>e</i> (<i>e</i> is the elementary charge), while the natural charges for carbon atoms of the diethynyl group decrease in comparison with the charge for the carbon atom of the ethynyl group from –0.42<i>e</i> to –0.36<i>e</i>.</p>","PeriodicalId":671,"journal":{"name":"Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques","volume":"18 4","pages":"958 - 964"},"PeriodicalIF":0.5000,"publicationDate":"2024-09-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Atomic and Electronic Structure of Organosilicon Polymers of Acetylene Derivatives: X-ray Spectral and Theoretical Study\",\"authors\":\"M. M. Tatevosyan, V. G. Vlasenko, A. A. Shiryaeva, T. N. 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引用次数: 0
摘要
利用密度泛函理论和 X 射线发射光谱学的方法,研究了乙炔和二乙炔类型的两种有机硅聚合物 [-Ph2Si-(C≡C)2-]n (P1) 和 [-Ph2Si-(C≡C-C≡C)2-]m (P2)(其中 Ph 为苯基)的原子和电子结构。这些聚合物的 SiKβ1 X 射线发射光谱是根据量子化学计算获得的部分电子态分布分析解释的。根据对混合天然键轨道的分析,获得了所研究聚合物中原子化学作用参数的定量特征,如原子群、自然电荷和电子构型。自然键轨道的极化系数值表明电子密度主要集中在碳原子上。不同片段中碳原子的电子构型差异很大。对于乙炔基(二乙炔基)片段的碳原子,它们接近 sp1.03 (P1) 和 sp0.95 (P2) 类型的线性 σ 键,而对于苯基片段的碳原子,它们的电子构型为 sp2.42,介于 sp2 和 sp3 之间,与分子几何形状相符。两种聚合物中 Si 原子上的自然电荷几乎相同:+1.58e、+1.59e(e 为基本电荷),而二乙炔基碳原子上的自然电荷与乙炔基碳原子上的电荷相比从-0.42e 降至-0.36e。
Atomic and Electronic Structure of Organosilicon Polymers of Acetylene Derivatives: X-ray Spectral and Theoretical Study
The atomic and electronic structures of two organosilicon polymers [–Ph2Si–(C≡C)2–]n (P1) and [–Ph2Si–(C≡C–C≡C)2–]m (P2) (where Ph is a phenyl group) of acetylene and diacetylene types are studied using the methods of density functional theory and X-ray emission spectroscopy. The SiKβ1 X-ray emission spectra of these polymers are interpreted on the basis of analysis of the distribution of partial electronic states obtained from quantum chemical calculations. The quantitative characteristics of the parameters of the chemical interaction of atoms, such as population, natural charges, and electronic configurations in the studied polymers, are obtained on the basis of analysis of hybrid natural bond orbitals. The values of the polarization coefficients of natural bond orbitals indicate the localization of electron density predominantly on carbon atoms. The electronic configurations for carbon atoms in different fragments differ significantly. For the C atoms of ethynyl (diethynyl) fragments, they are close to the linear σ bond of the sp1.03 (P1) and sp0.95 (P2) type, while for the C atoms of phenyl fragments, they are sp2.42, which are intermediate between sp2 and sp3, in accordance with molecular geometry. The natural charges on Si in both polymers are almost the same: +1.58e, +1.59e (e is the elementary charge), while the natural charges for carbon atoms of the diethynyl group decrease in comparison with the charge for the carbon atom of the ethynyl group from –0.42e to –0.36e.
期刊介绍:
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques publishes original articles on the topical problems of solid-state physics, materials science, experimental techniques, condensed media, nanostructures, surfaces of thin films, and phase boundaries: geometric and energetical structures of surfaces, the methods of computer simulations; physical and chemical properties and their changes upon radiation and other treatments; the methods of studies of films and surface layers of crystals (XRD, XPS, synchrotron radiation, neutron and electron diffraction, electron microscopic, scanning tunneling microscopic, atomic force microscopic studies, and other methods that provide data on the surfaces and thin films). Articles related to the methods and technics of structure studies are the focus of the journal. The journal accepts manuscripts of regular articles and reviews in English or Russian language from authors of all countries. All manuscripts are peer-reviewed.