Jingjing Xia, Jun Yu, Siwen Lu, Chunan Xue, Yifan Zhu, Yufei Feng, Pengfeng Sheng, Zhanshan Wang
{"title":"基于二维功率谱密度分析提取光学表面微测量的各向同性和各向异性成分","authors":"Jingjing Xia, Jun Yu, Siwen Lu, Chunan Xue, Yifan Zhu, Yufei Feng, Pengfeng Sheng, Zhanshan Wang","doi":"10.1016/j.precisioneng.2024.10.001","DOIUrl":null,"url":null,"abstract":"<div><div>Extraction of surface characteristics is essential during surface processing and optical inspections. In this work, we propose a new extraction method by dividing the global feature within multiple directions into isotropic and anisotropic components and combining noise filtration, two-dimensional component extraction, and fast reconstruction. The mathematical descriptions of global and local features were derived. The noise by holes, scratches, and finite sampling points was restrained by Bearing Ratio analysis, Hough transform, and Welch window operation. The isotropic and anisotropic surface components were extracted in the two-dimensional power spectral density domain, reconstructed in the two-dimensional Fourier domain, and inversed in Cartesian coordinates. Five surfaces with anisotropic structural characteristics ranging from zero to two dimensions were analyzed. The general applicability was proved according to the consistency between surface processing methods and extracted results. A chemical mechanical polishing experiment was designed and accomplished to verify the sensitivity of the extraction method. The subtle variation in surface morphology was captured on the reconstructed surfaces near the polishing end-point, confirming its detectability on weak anisotropic components. This process-oriented surface extraction method can achieve qualified results without transcendental knowledge of surface conditions and offers openness to various surface evaluation criteria by statistical roughness indicators, which supports surface inspection for multiple surface processing techniques.</div></div>","PeriodicalId":54589,"journal":{"name":"Precision Engineering-Journal of the International Societies for Precision Engineering and Nanotechnology","volume":"91 ","pages":"Pages 344-357"},"PeriodicalIF":3.5000,"publicationDate":"2024-10-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Extraction of isotropic and anisotropic components for optical surface micro-metrology based on the two-dimensional power spectral density analysis\",\"authors\":\"Jingjing Xia, Jun Yu, Siwen Lu, Chunan Xue, Yifan Zhu, Yufei Feng, Pengfeng Sheng, Zhanshan Wang\",\"doi\":\"10.1016/j.precisioneng.2024.10.001\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><div>Extraction of surface characteristics is essential during surface processing and optical inspections. In this work, we propose a new extraction method by dividing the global feature within multiple directions into isotropic and anisotropic components and combining noise filtration, two-dimensional component extraction, and fast reconstruction. The mathematical descriptions of global and local features were derived. The noise by holes, scratches, and finite sampling points was restrained by Bearing Ratio analysis, Hough transform, and Welch window operation. The isotropic and anisotropic surface components were extracted in the two-dimensional power spectral density domain, reconstructed in the two-dimensional Fourier domain, and inversed in Cartesian coordinates. Five surfaces with anisotropic structural characteristics ranging from zero to two dimensions were analyzed. The general applicability was proved according to the consistency between surface processing methods and extracted results. A chemical mechanical polishing experiment was designed and accomplished to verify the sensitivity of the extraction method. The subtle variation in surface morphology was captured on the reconstructed surfaces near the polishing end-point, confirming its detectability on weak anisotropic components. This process-oriented surface extraction method can achieve qualified results without transcendental knowledge of surface conditions and offers openness to various surface evaluation criteria by statistical roughness indicators, which supports surface inspection for multiple surface processing techniques.</div></div>\",\"PeriodicalId\":54589,\"journal\":{\"name\":\"Precision Engineering-Journal of the International Societies for Precision Engineering and Nanotechnology\",\"volume\":\"91 \",\"pages\":\"Pages 344-357\"},\"PeriodicalIF\":3.5000,\"publicationDate\":\"2024-10-02\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Precision Engineering-Journal of the International Societies for Precision Engineering and Nanotechnology\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://www.sciencedirect.com/science/article/pii/S0141635924002289\",\"RegionNum\":2,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q2\",\"JCRName\":\"ENGINEERING, MANUFACTURING\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Precision Engineering-Journal of the International Societies for Precision Engineering and Nanotechnology","FirstCategoryId":"5","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0141635924002289","RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"ENGINEERING, MANUFACTURING","Score":null,"Total":0}
Extraction of isotropic and anisotropic components for optical surface micro-metrology based on the two-dimensional power spectral density analysis
Extraction of surface characteristics is essential during surface processing and optical inspections. In this work, we propose a new extraction method by dividing the global feature within multiple directions into isotropic and anisotropic components and combining noise filtration, two-dimensional component extraction, and fast reconstruction. The mathematical descriptions of global and local features were derived. The noise by holes, scratches, and finite sampling points was restrained by Bearing Ratio analysis, Hough transform, and Welch window operation. The isotropic and anisotropic surface components were extracted in the two-dimensional power spectral density domain, reconstructed in the two-dimensional Fourier domain, and inversed in Cartesian coordinates. Five surfaces with anisotropic structural characteristics ranging from zero to two dimensions were analyzed. The general applicability was proved according to the consistency between surface processing methods and extracted results. A chemical mechanical polishing experiment was designed and accomplished to verify the sensitivity of the extraction method. The subtle variation in surface morphology was captured on the reconstructed surfaces near the polishing end-point, confirming its detectability on weak anisotropic components. This process-oriented surface extraction method can achieve qualified results without transcendental knowledge of surface conditions and offers openness to various surface evaluation criteria by statistical roughness indicators, which supports surface inspection for multiple surface processing techniques.
期刊介绍:
Precision Engineering - Journal of the International Societies for Precision Engineering and Nanotechnology is devoted to the multidisciplinary study and practice of high accuracy engineering, metrology, and manufacturing. The journal takes an integrated approach to all subjects related to research, design, manufacture, performance validation, and application of high precision machines, instruments, and components, including fundamental and applied research and development in manufacturing processes, fabrication technology, and advanced measurement science. The scope includes precision-engineered systems and supporting metrology over the full range of length scales, from atom-based nanotechnology and advanced lithographic technology to large-scale systems, including optical and radio telescopes and macrometrology.