Yang Wang , Yongao Zhao , Xu Zhang , Yufeng Zhang , Jingmin Dai
{"title":"在 2-14 μm 范围内测量电子元件热管理材料的正常光谱发射率","authors":"Yang Wang , Yongao Zhao , Xu Zhang , Yufeng Zhang , Jingmin Dai","doi":"10.1016/j.infrared.2024.105568","DOIUrl":null,"url":null,"abstract":"<div><div>Reducing the operating temperature of electronic components is an effective method for enhancing their performance. Selecting suitable thermal management materials is crucial for optimizing cooling efficiency. Normal spectral emissivity, a dimensionless physical quantity, is key in assessing a material’s capability for radiative cooling. This paper outlines the construction of a reflective infrared emissivity measurement apparatus using the IS-50 Fourier Transform Infrared Spectrometer. A gold-coated diffuse integrating sphere was strategically placed in the spectrometer’s sample chamber. By ingeniously leveraging the spectrometer’s original optical path, a dual-sided gold-coated mirror was employed to capture both incident and reflected light, enabling accurate measurements of the normal spectral emissivity of materials used for cooling electronic components. The measurement results for typical materials were consistent with those reported in the literature, satisfyingly so. The uncertainty of the measurement setup was thoroughly evaluated, achieving a combined uncertainty of better than 1 %. This experimental study measured the normal spectral emissivity of various thermal management materials and analyzed the influence of temperature on normal spectral emissivity. These results provide crucial data support for thermal design, simulation analysis, and temperature monitoring in the development of thermal structures for electronic components.</div></div>","PeriodicalId":13549,"journal":{"name":"Infrared Physics & Technology","volume":null,"pages":null},"PeriodicalIF":3.1000,"publicationDate":"2024-09-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Normal spectral emissivity measurement of thermal management materials for electronic components in the 2–14 μm range\",\"authors\":\"Yang Wang , Yongao Zhao , Xu Zhang , Yufeng Zhang , Jingmin Dai\",\"doi\":\"10.1016/j.infrared.2024.105568\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><div>Reducing the operating temperature of electronic components is an effective method for enhancing their performance. Selecting suitable thermal management materials is crucial for optimizing cooling efficiency. Normal spectral emissivity, a dimensionless physical quantity, is key in assessing a material’s capability for radiative cooling. This paper outlines the construction of a reflective infrared emissivity measurement apparatus using the IS-50 Fourier Transform Infrared Spectrometer. A gold-coated diffuse integrating sphere was strategically placed in the spectrometer’s sample chamber. By ingeniously leveraging the spectrometer’s original optical path, a dual-sided gold-coated mirror was employed to capture both incident and reflected light, enabling accurate measurements of the normal spectral emissivity of materials used for cooling electronic components. The measurement results for typical materials were consistent with those reported in the literature, satisfyingly so. The uncertainty of the measurement setup was thoroughly evaluated, achieving a combined uncertainty of better than 1 %. This experimental study measured the normal spectral emissivity of various thermal management materials and analyzed the influence of temperature on normal spectral emissivity. These results provide crucial data support for thermal design, simulation analysis, and temperature monitoring in the development of thermal structures for electronic components.</div></div>\",\"PeriodicalId\":13549,\"journal\":{\"name\":\"Infrared Physics & Technology\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":3.1000,\"publicationDate\":\"2024-09-29\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Infrared Physics & Technology\",\"FirstCategoryId\":\"101\",\"ListUrlMain\":\"https://www.sciencedirect.com/science/article/pii/S1350449524004523\",\"RegionNum\":3,\"RegionCategory\":\"物理与天体物理\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q2\",\"JCRName\":\"INSTRUMENTS & INSTRUMENTATION\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Infrared Physics & Technology","FirstCategoryId":"101","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S1350449524004523","RegionNum":3,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"INSTRUMENTS & INSTRUMENTATION","Score":null,"Total":0}
Normal spectral emissivity measurement of thermal management materials for electronic components in the 2–14 μm range
Reducing the operating temperature of electronic components is an effective method for enhancing their performance. Selecting suitable thermal management materials is crucial for optimizing cooling efficiency. Normal spectral emissivity, a dimensionless physical quantity, is key in assessing a material’s capability for radiative cooling. This paper outlines the construction of a reflective infrared emissivity measurement apparatus using the IS-50 Fourier Transform Infrared Spectrometer. A gold-coated diffuse integrating sphere was strategically placed in the spectrometer’s sample chamber. By ingeniously leveraging the spectrometer’s original optical path, a dual-sided gold-coated mirror was employed to capture both incident and reflected light, enabling accurate measurements of the normal spectral emissivity of materials used for cooling electronic components. The measurement results for typical materials were consistent with those reported in the literature, satisfyingly so. The uncertainty of the measurement setup was thoroughly evaluated, achieving a combined uncertainty of better than 1 %. This experimental study measured the normal spectral emissivity of various thermal management materials and analyzed the influence of temperature on normal spectral emissivity. These results provide crucial data support for thermal design, simulation analysis, and temperature monitoring in the development of thermal structures for electronic components.
期刊介绍:
The Journal covers the entire field of infrared physics and technology: theory, experiment, application, devices and instrumentation. Infrared'' is defined as covering the near, mid and far infrared (terahertz) regions from 0.75um (750nm) to 1mm (300GHz.) Submissions in the 300GHz to 100GHz region may be accepted at the editors discretion if their content is relevant to shorter wavelengths. Submissions must be primarily concerned with and directly relevant to this spectral region.
Its core topics can be summarized as the generation, propagation and detection, of infrared radiation; the associated optics, materials and devices; and its use in all fields of science, industry, engineering and medicine.
Infrared techniques occur in many different fields, notably spectroscopy and interferometry; material characterization and processing; atmospheric physics, astronomy and space research. Scientific aspects include lasers, quantum optics, quantum electronics, image processing and semiconductor physics. Some important applications are medical diagnostics and treatment, industrial inspection and environmental monitoring.