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引用次数: 0
摘要
对于具有复杂电磁环境的航天器来说,舱室间隙电磁辐射泄漏的定位是电磁兼容性(EMC)设计的一个关键和具有挑战性的方面。本文提出了一种基于合成孔径干涉被动辐射测量成像的定位方法。在距离航天器表面一定距离处测量电磁辐射信号,形成可见度样本。能见度样本与电磁辐射泄漏校正亮度温度之间建立了傅里叶变换对。通过反傅里叶变换获得航天器表面电磁泄漏位置图像。提出了一种基于蚁群优化的稀疏采样方法,以提高测试效率。分析了位置参数、测试天线定位精度、扫描参数和测量接收器振幅/相位误差等各种因素对成像结果的影响。在一个表面有 51 个孔的 1 m × 1 m × 1 m 机舱上进行了实验,验证了本文提出的算法能有效地对不同频率的电磁泄漏点进行成像和定位。稀疏采样的有效性也得到了验证,定位精度达到了 90.2%,测试时间节省了 81.9%。
Synthetic Aperture Interferometric Passive Radiometer Imaging to Locate Electromagnetic Leakage From Spacecraft Surface
The localization of electromagnetic radiation leakage through cabin gaps is a critical and challenging aspect of electromagnetic compatibility (EMC) design for spacecraft with complex electromagnetic environments. This paper proposes a localization method based on synthetic aperture interferometric passive radiometry imaging. Electromagnetic radiation signals are measured at a certain distance from the spacecraft surface to form visibility samples. A Fourier transform pair between the visibility sample and the corrected brightness temperature for electromagnetic radiation leakage is established. The spacecraft surface electromagnetic leakage location image is obtained through the inverse Fourier transform. A sparse sampling method based on ant colony optimization was proposed to improve testing efficiency. The impacts of various factors, including positional parameters, positioning accuracy of the test antenna, scanning parameters, and measurement receiver amplitude/phase errors on the imaging results are analyzed. Experiments were conducted on a 1 m × 1 m × 1 m cabin with 51 holes on one surface, and the algorithm proposed in this paper was validated to effectively image and locate electromagnetic leakage points at different frequencies. The effectiveness of sparse sampling was also verified, with a localization accuracy of 90.2% and a testing time savings of 81.9%.
期刊介绍:
IET Circuits, Devices & Systems covers the following topics:
Circuit theory and design, circuit analysis and simulation, computer aided design
Filters (analogue and switched capacitor)
Circuit implementations, cells and architectures for integration including VLSI
Testability, fault tolerant design, minimisation of circuits and CAD for VLSI
Novel or improved electronic devices for both traditional and emerging technologies including nanoelectronics and MEMs
Device and process characterisation, device parameter extraction schemes
Mathematics of circuits and systems theory
Test and measurement techniques involving electronic circuits, circuits for industrial applications, sensors and transducers