撤稿说明：通过混合人工智能方法在云环境中进行信任授权异常检测，实现安全高效的工业 4.0 转型

{"title":"撤稿说明：通过混合人工智能方法在云环境中进行信任授权异常检测，实现安全高效的工业 4.0 转型","authors":"N. Prakash, J. Vignesh, M. Ashwin, Sudhir Ramadass, N. Veeranjaneyulu, Shashikant V. Athawale, Ananda Ravuri, Balambigai Subramanian","doi":"10.1007/s11082-024-07717-5","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":720,"journal":{"name":"Optical and Quantum Electronics","volume":null,"pages":null},"PeriodicalIF":3.3000,"publicationDate":"2024-10-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Retraction Note: Enabling secure and efficient industry 4.0 transformation through trust-authorized anomaly detection in cloud environments with a hybrid AI approach\",\"authors\":\"N. Prakash, J. Vignesh, M. Ashwin, Sudhir Ramadass, N. Veeranjaneyulu, Shashikant V. Athawale, Ananda Ravuri, Balambigai Subramanian\",\"doi\":\"10.1007/s11082-024-07717-5\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":720,\"journal\":{\"name\":\"Optical and Quantum Electronics\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":3.3000,\"publicationDate\":\"2024-10-14\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Optical and Quantum Electronics\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://link.springer.com/article/10.1007/s11082-024-07717-5\",\"RegionNum\":3,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q2\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Optical and Quantum Electronics","FirstCategoryId":"5","ListUrlMain":"https://link.springer.com/article/10.1007/s11082-024-07717-5","RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}