具有数字消除 DAC 错误功能的 90 美元-dBFS-IM$_{3}$、164 美元-dBFS/Hz-NSD、700 兆赫带宽连续时间流水线 ADC

IF 4.6 1区 工程技术 Q1 ENGINEERING, ELECTRICAL & ELECTRONIC IEEE Journal of Solid-state Circuits Pub Date : 2024-10-14 DOI:10.1109/JSSC.2024.3470516
Sharvil Patil;Asha Ganesan;Hajime Shibata;Victor Kozlov;Gerry Taylor;Prawal Shrestha;Zhao Li;Zeynep Lulec;Konstantinos Vasilakopoulos;Raviteja Theertham;Donald Paterson;Qingnan Yu;Aseer Chowdhury
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引用次数: 0

摘要

本文介绍了一种连续时间 (CT) 流水线模数转换器 (ADC),它代表了在三阶失真和噪声两个维度上的技术进步。通过片上数字消除静态和定时数模转换器 (DAC) 的不匹配误差来解决失真问题。低噪声是通过以下设计方案实现的:电阻式次级数模转换器;高精度片上背景校准数字重建滤波器(DRF);以及允许可编程采样频率的可调 LC 晶格延迟。6.4-GS/s 原型采用 16 纳米 FinFET 工艺实现,在 700 MHz 带宽上实现了 -90 dBFS 的 IM3 和 -164 dBFS/Hz 的小信号 NSD,功耗为 703 mW。这样的性能使其适用于高性能仪器和通信领域,这些领域要求在对小信号进行数字化的同时,还能抵御大干扰。
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A −90-dBFS-IM3, −164-dBFS/Hz-NSD, 700-MHz-Bandwidth Continuous-Time Pipelined ADC With Digital Cancellation of DAC Errors
This paper describes a continuous-time (CT) pipelined analog-to-digital converter (ADC) that represents a technology push along both—third-order distortion and noise—dimensions. Distortion is tackled using on-chip digital cancellation of static and timing digital-to-analog converter (DAC) mismatch errors. Low noise is achieved with design choices such as a resistive sub-DAC; a high-precision, on-chip, background-calibrated digital reconstruction filter (DRF); and a tunable LC lattice delay that allows a programmable sampling frequency. Implemented in a 16-nm FinFET process, the 6.4-GS/s prototype achieves an IM3 of −90 dBFS and a small-signal NSD of −164 dBFS/Hz over a 700-MHz bandwidth, while dissipating 703-mW power. Such performance makes it suitable for high-performance instrumentation and communications that demand robustness to large interferers while digitizing small signals.
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来源期刊
IEEE Journal of Solid-state Circuits
IEEE Journal of Solid-state Circuits 工程技术-工程:电子与电气
CiteScore
11.00
自引率
20.40%
发文量
351
审稿时长
3-6 weeks
期刊介绍: The IEEE Journal of Solid-State Circuits publishes papers each month in the broad area of solid-state circuits with particular emphasis on transistor-level design of integrated circuits. It also provides coverage of topics such as circuits modeling, technology, systems design, layout, and testing that relate directly to IC design. Integrated circuits and VLSI are of principal interest; material related to discrete circuit design is seldom published. Experimental verification is strongly encouraged.
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