FARCOS 阵列的像素化方法

G. Cardella , N.S. Martorana , L. Acosta , G. D’Agata , E. De Filippo , E. Geraci , B. Gnoffo , C. Guazzoni , C. Maiolino , A. Pagano , E.V. Pagano , M. Papa , S. Pirrone , G. Politi , F. Risitano , F. Rizzo , P. Russotto , G. Santagati , M. Trimarchi , C. Zagami
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引用次数: 0

摘要

像素化方法解决了为撞击探测器区域的每个粒子准确分配坐标的难题。这里介绍的像素化方法用于分析使用用于相关和光谱分析的 Femtoscope ARray FARCOS 的双面硅带探测器获取的数据。应用像素化方法需要完成几项任务。首先,前后信号粒子检测时间的重合可以消除杂散事件。第二项基本操作是通过比较所有可能配置中检测到的前后侧信号的能量来恢复带间事件。通过分析两阿尔法重合点和观察 8Beg.s. 共振,可以比较条带间事件和单条带事件的能量分辨率。利用这种像素化方法,探测三阿尔法粒子的效率提高了 41 ± 8%。
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Pixelation method for the FARCOS array
A pixelation method addresses the challenge of accurately assigning coordinates to each particle that impinges on the detector area. The pixelation method used for the analysis of the data acquired with Double-Sided Silicon Strip Detectors of the Femtoscope ARray for COrrelations and Spectroscopy FARCOS is described here. The application of the pixelation method requires several tasks to be performed. First, the coincidence in the detection time of the particles of front and back signals allows the elimination of spurious events. The second fundamental operation is the recovery of inter-strip events obtained comparing the energies of detected front and back side signals in all possible configurations. Two-alpha coincidences are analysed and the 8Beg.s. resonance is observed to compare the energy resolution of recovered inter-strip events with that of single-strip events. Using this pixelation method, a 41 ± 8% improvement in the efficiency of detecting three-alpha particles was achieved.
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来源期刊
CiteScore
3.20
自引率
21.40%
发文量
787
审稿时长
1 months
期刊介绍: Section A of Nuclear Instruments and Methods in Physics Research publishes papers on design, manufacturing and performance of scientific instruments with an emphasis on large scale facilities. This includes the development of particle accelerators, ion sources, beam transport systems and target arrangements as well as the use of secondary phenomena such as synchrotron radiation and free electron lasers. It also includes all types of instrumentation for the detection and spectrometry of radiations from high energy processes and nuclear decays, as well as instrumentation for experiments at nuclear reactors. Specialized electronics for nuclear and other types of spectrometry as well as computerization of measurements and control systems in this area also find their place in the A section. Theoretical as well as experimental papers are accepted.
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