{"title":"利用下一代光矢量频谱分析仪直接测量波导的相位","authors":"Andrew Grieco","doi":"10.1038/s41377-024-01574-3","DOIUrl":null,"url":null,"abstract":"<p>A novel dual-mode optical vector spectrum analyzer is demonstrated that is suitable for the characterization of both passive devices as well as active laser sources. It can measure loss, phase response, and dispersion properties over a broad bandwidth, with high resolution and dynamic range.</p>","PeriodicalId":18069,"journal":{"name":"Light-Science & Applications","volume":"209 1","pages":""},"PeriodicalIF":20.6000,"publicationDate":"2024-10-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Direct phase measurement of waveguides with a next generation optical vector spectrum analyzer\",\"authors\":\"Andrew Grieco\",\"doi\":\"10.1038/s41377-024-01574-3\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<p>A novel dual-mode optical vector spectrum analyzer is demonstrated that is suitable for the characterization of both passive devices as well as active laser sources. It can measure loss, phase response, and dispersion properties over a broad bandwidth, with high resolution and dynamic range.</p>\",\"PeriodicalId\":18069,\"journal\":{\"name\":\"Light-Science & Applications\",\"volume\":\"209 1\",\"pages\":\"\"},\"PeriodicalIF\":20.6000,\"publicationDate\":\"2024-10-19\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Light-Science & Applications\",\"FirstCategoryId\":\"1089\",\"ListUrlMain\":\"https://doi.org/10.1038/s41377-024-01574-3\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q1\",\"JCRName\":\"OPTICS\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Light-Science & Applications","FirstCategoryId":"1089","ListUrlMain":"https://doi.org/10.1038/s41377-024-01574-3","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"OPTICS","Score":null,"Total":0}
Direct phase measurement of waveguides with a next generation optical vector spectrum analyzer
A novel dual-mode optical vector spectrum analyzer is demonstrated that is suitable for the characterization of both passive devices as well as active laser sources. It can measure loss, phase response, and dispersion properties over a broad bandwidth, with high resolution and dynamic range.
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