{"title":"用于高灵敏度光检测的硅锗/硅异质结光电晶体管","authors":"Hongyun Xie;Xiaoting Shen;Yunpeng Ge;Zimai Xu;Ziming Liu;Yudong Ma;Weicong Na;Dongyue Jin;Wanrong Zhang","doi":"10.1109/TED.2024.3467218","DOIUrl":null,"url":null,"abstract":"Silicon-based heterojunction phototransistors (HPTs) with their advantages of high internal gain, high responsivity, and compatibility with CMOS processes have attracted much attention in high-sensitivity light detection. In this article, the SiGe/Si HPT with an illuminated area of \n<inline-formula> <tex-math>$50\\times 50~\\mu $ </tex-math></inline-formula>\nm2 for high responsivity and sensitivity was designed and fabricated. The optical responsivity of the fabricated SiGe/Si HPT reached 1.717 and 12.379 A/W for 405 and 650 nm, their specific detectivity values were \n<inline-formula> <tex-math>$1.54\\times 10^{{10}}$ </tex-math></inline-formula>\n and \n<inline-formula> <tex-math>$11.16\\times 10^{{10}}~\\text {cm}\\cdot \\text {Hz}^{{0.5}}\\cdot \\text {W}^{-{1}}$ </tex-math></inline-formula>\n, respectively. An analytic model was developed to discuss current amplification for different wavelengths when considering absorption efficiency and carrier transportation. The emitter thickness was optimized as 60 nm to significantly improve the current amplification under short wavelengths. The achieved optical responsivity of the optimized SiGe/Si HPT for 405 and 650 nm respectively were 13.756 and 13.904 A/W, and the specific detectivity were \n<inline-formula> <tex-math>$12.41\\times 10^{{10}}$ </tex-math></inline-formula>\n and \n<inline-formula> <tex-math>$12.54\\times 10^{{10}}~\\text {cm}\\cdot \\text {Hz}^{{0.5}} \\cdot \\text {W}^{-{1}}$ </tex-math></inline-formula>\n.","PeriodicalId":13092,"journal":{"name":"IEEE Transactions on Electron Devices","volume":"71 11","pages":"6857-6863"},"PeriodicalIF":2.9000,"publicationDate":"2024-10-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"A SiGe/Si Heterojunction Phototransistor for High Sensitivity Light Detection\",\"authors\":\"Hongyun Xie;Xiaoting Shen;Yunpeng Ge;Zimai Xu;Ziming Liu;Yudong Ma;Weicong Na;Dongyue Jin;Wanrong Zhang\",\"doi\":\"10.1109/TED.2024.3467218\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Silicon-based heterojunction phototransistors (HPTs) with their advantages of high internal gain, high responsivity, and compatibility with CMOS processes have attracted much attention in high-sensitivity light detection. In this article, the SiGe/Si HPT with an illuminated area of \\n<inline-formula> <tex-math>$50\\\\times 50~\\\\mu $ </tex-math></inline-formula>\\nm2 for high responsivity and sensitivity was designed and fabricated. The optical responsivity of the fabricated SiGe/Si HPT reached 1.717 and 12.379 A/W for 405 and 650 nm, their specific detectivity values were \\n<inline-formula> <tex-math>$1.54\\\\times 10^{{10}}$ </tex-math></inline-formula>\\n and \\n<inline-formula> <tex-math>$11.16\\\\times 10^{{10}}~\\\\text {cm}\\\\cdot \\\\text {Hz}^{{0.5}}\\\\cdot \\\\text {W}^{-{1}}$ </tex-math></inline-formula>\\n, respectively. An analytic model was developed to discuss current amplification for different wavelengths when considering absorption efficiency and carrier transportation. The emitter thickness was optimized as 60 nm to significantly improve the current amplification under short wavelengths. The achieved optical responsivity of the optimized SiGe/Si HPT for 405 and 650 nm respectively were 13.756 and 13.904 A/W, and the specific detectivity were \\n<inline-formula> <tex-math>$12.41\\\\times 10^{{10}}$ </tex-math></inline-formula>\\n and \\n<inline-formula> <tex-math>$12.54\\\\times 10^{{10}}~\\\\text {cm}\\\\cdot \\\\text {Hz}^{{0.5}} \\\\cdot \\\\text {W}^{-{1}}$ </tex-math></inline-formula>\\n.\",\"PeriodicalId\":13092,\"journal\":{\"name\":\"IEEE Transactions on Electron Devices\",\"volume\":\"71 11\",\"pages\":\"6857-6863\"},\"PeriodicalIF\":2.9000,\"publicationDate\":\"2024-10-08\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE Transactions on Electron Devices\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://ieeexplore.ieee.org/document/10709352/\",\"RegionNum\":2,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q2\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Electron Devices","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/10709352/","RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
A SiGe/Si Heterojunction Phototransistor for High Sensitivity Light Detection
Silicon-based heterojunction phototransistors (HPTs) with their advantages of high internal gain, high responsivity, and compatibility with CMOS processes have attracted much attention in high-sensitivity light detection. In this article, the SiGe/Si HPT with an illuminated area of
$50\times 50~\mu $
m2 for high responsivity and sensitivity was designed and fabricated. The optical responsivity of the fabricated SiGe/Si HPT reached 1.717 and 12.379 A/W for 405 and 650 nm, their specific detectivity values were
$1.54\times 10^{{10}}$
and
$11.16\times 10^{{10}}~\text {cm}\cdot \text {Hz}^{{0.5}}\cdot \text {W}^{-{1}}$
, respectively. An analytic model was developed to discuss current amplification for different wavelengths when considering absorption efficiency and carrier transportation. The emitter thickness was optimized as 60 nm to significantly improve the current amplification under short wavelengths. The achieved optical responsivity of the optimized SiGe/Si HPT for 405 and 650 nm respectively were 13.756 and 13.904 A/W, and the specific detectivity were
$12.41\times 10^{{10}}$
and
$12.54\times 10^{{10}}~\text {cm}\cdot \text {Hz}^{{0.5}} \cdot \text {W}^{-{1}}$
.
期刊介绍:
IEEE Transactions on Electron Devices publishes original and significant contributions relating to the theory, modeling, design, performance and reliability of electron and ion integrated circuit devices and interconnects, involving insulators, metals, organic materials, micro-plasmas, semiconductors, quantum-effect structures, vacuum devices, and emerging materials with applications in bioelectronics, biomedical electronics, computation, communications, displays, microelectromechanics, imaging, micro-actuators, nanoelectronics, optoelectronics, photovoltaics, power ICs and micro-sensors. Tutorial and review papers on these subjects are also published and occasional special issues appear to present a collection of papers which treat particular areas in more depth and breadth.