基于协同进化结合概率分布优化的表征学习,用于精确缺陷定位。

IF 10.2 1区 计算机科学 Q1 COMPUTER SCIENCE, ARTIFICIAL INTELLIGENCE IEEE transactions on neural networks and learning systems Pub Date : 2024-10-28 DOI:10.1109/TNNLS.2024.3479734
Jinglin Zhang, Zekai Zhang, Qinghui Chen, Gang Li, Weiyu Li, Shijiao Ding, Maomao Xiong, Wenhao Zhang, Shengyong Chen
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引用次数: 0

摘要

基于表征学习的视觉缺陷检测方法在工业场景中发挥着重要作用。基于表征学习的缺陷检测技术已经取得了重大进展。然而,现有的缺陷检测方法仍然面临三个挑战:首先,工业缺陷样本极其稀少,导致训练困难。其次,由于工业缺陷具有模糊和背景干扰等特点,获取模糊缺陷分离边缘和上下文信息具有挑战性。第三,工业缺陷无法获得准确的定位信息。本文提出了特征协同进化交互架构(CIA)和玻璃容器缺陷数据集来解决上述难题。具体来说,本文的贡献如下:首先,本文设计了一个玻璃容器图像采集系统,结合 RGB 和偏振信息,创建了一个包含 60 000 多个样本的玻璃容器缺陷数据集,以缓解工业场景中样本稀缺的问题。随后,本文设计了 CIA。CIA 通过边缘特征和上下文特征的共同进化,优化了特征的概率分布,从而提高了在模糊缺陷和高噪声环境下的检测精度。最后,本文提出了一种新颖的inforced IoU loss(IIoU loss),它可以通过感知预测框的尺度变化获得更准确的位置信息。在三个主流工业制造类别(东北大学(NEU)-Det、玻璃容器、木材)中进行的缺陷检测实验表明,CIA 仅使用了 22.5 GFLOPs,平均精度(mAP)(东北大学-Det:88.74%,玻璃容器:95.38%,木材:68.42%)优于最先进的方法。
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Representation Learning Based on Co-Evolutionary Combined With Probability Distribution Optimization for Precise Defect Location.

Visual defect detection methods based on representation learning play an important role in industrial scenarios. Defect detection technology based on representation learning has made significant progress. However, existing defect detection methods still face three challenges: first, the extreme scarcity of industrial defect samples makes training difficult. Second, due to the characteristics of industrial defects, such as blur and background interference, it is challenging to obtain fuzzy defect separation edges and context information. Third, industrial defects cannot obtain accurate positioning information. This article proposes feature co-evolution interaction architecture (CIA) and glass container defect dataset to address the above challenges. Specifically, the contributions of this article are as follows: first, this article designs a glass container image acquisition system that combines RGB and polarization information to create a glass container defect dataset containing more than 60 000 samples to alleviate the sample scarcity problem in industrial scenarios. Subsequently, this article designs the CIA. CIA optimizes the probability distribution of features through the co-evolution of edge and context features, thereby improving detection accuracy in blurred defects and noisy environments. Finally, this article proposes a novel inforced IoU loss (IIoU loss), which can obtain more accurate position information by being aware of the scale changes of the predicted box. Defect detection experiments in three mainstream industrial manufacturing categories (Northeastern University (NEU)-Det, glass containers, wood) show that CIA only uses 22.5 GFLOPs, and mean average precision (mAP) (NEU-Det: 88.74%, glass containers: 95.38%, wood: 68.42%) outperforms state-of-the-art methods.

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来源期刊
IEEE transactions on neural networks and learning systems
IEEE transactions on neural networks and learning systems COMPUTER SCIENCE, ARTIFICIAL INTELLIGENCE-COMPUTER SCIENCE, HARDWARE & ARCHITECTURE
CiteScore
23.80
自引率
9.60%
发文量
2102
审稿时长
3-8 weeks
期刊介绍: The focus of IEEE Transactions on Neural Networks and Learning Systems is to present scholarly articles discussing the theory, design, and applications of neural networks as well as other learning systems. The journal primarily highlights technical and scientific research in this domain.
期刊最新文献
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