{"title":"基于协同进化结合概率分布优化的表征学习,用于精确缺陷定位。","authors":"Jinglin Zhang, Zekai Zhang, Qinghui Chen, Gang Li, Weiyu Li, Shijiao Ding, Maomao Xiong, Wenhao Zhang, Shengyong Chen","doi":"10.1109/TNNLS.2024.3479734","DOIUrl":null,"url":null,"abstract":"<p><p>Visual defect detection methods based on representation learning play an important role in industrial scenarios. Defect detection technology based on representation learning has made significant progress. However, existing defect detection methods still face three challenges: first, the extreme scarcity of industrial defect samples makes training difficult. Second, due to the characteristics of industrial defects, such as blur and background interference, it is challenging to obtain fuzzy defect separation edges and context information. Third, industrial defects cannot obtain accurate positioning information. This article proposes feature co-evolution interaction architecture (CIA) and glass container defect dataset to address the above challenges. Specifically, the contributions of this article are as follows: first, this article designs a glass container image acquisition system that combines RGB and polarization information to create a glass container defect dataset containing more than 60 000 samples to alleviate the sample scarcity problem in industrial scenarios. Subsequently, this article designs the CIA. CIA optimizes the probability distribution of features through the co-evolution of edge and context features, thereby improving detection accuracy in blurred defects and noisy environments. Finally, this article proposes a novel inforced IoU loss (IIoU loss), which can obtain more accurate position information by being aware of the scale changes of the predicted box. Defect detection experiments in three mainstream industrial manufacturing categories (Northeastern University (NEU)-Det, glass containers, wood) show that CIA only uses 22.5 GFLOPs, and mean average precision (mAP) (NEU-Det: 88.74%, glass containers: 95.38%, wood: 68.42%) outperforms state-of-the-art methods.</p>","PeriodicalId":13303,"journal":{"name":"IEEE transactions on neural networks and learning systems","volume":"PP ","pages":""},"PeriodicalIF":10.2000,"publicationDate":"2024-10-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Representation Learning Based on Co-Evolutionary Combined With Probability Distribution Optimization for Precise Defect Location.\",\"authors\":\"Jinglin Zhang, Zekai Zhang, Qinghui Chen, Gang Li, Weiyu Li, Shijiao Ding, Maomao Xiong, Wenhao Zhang, Shengyong Chen\",\"doi\":\"10.1109/TNNLS.2024.3479734\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<p><p>Visual defect detection methods based on representation learning play an important role in industrial scenarios. Defect detection technology based on representation learning has made significant progress. However, existing defect detection methods still face three challenges: first, the extreme scarcity of industrial defect samples makes training difficult. Second, due to the characteristics of industrial defects, such as blur and background interference, it is challenging to obtain fuzzy defect separation edges and context information. Third, industrial defects cannot obtain accurate positioning information. This article proposes feature co-evolution interaction architecture (CIA) and glass container defect dataset to address the above challenges. Specifically, the contributions of this article are as follows: first, this article designs a glass container image acquisition system that combines RGB and polarization information to create a glass container defect dataset containing more than 60 000 samples to alleviate the sample scarcity problem in industrial scenarios. Subsequently, this article designs the CIA. CIA optimizes the probability distribution of features through the co-evolution of edge and context features, thereby improving detection accuracy in blurred defects and noisy environments. Finally, this article proposes a novel inforced IoU loss (IIoU loss), which can obtain more accurate position information by being aware of the scale changes of the predicted box. Defect detection experiments in three mainstream industrial manufacturing categories (Northeastern University (NEU)-Det, glass containers, wood) show that CIA only uses 22.5 GFLOPs, and mean average precision (mAP) (NEU-Det: 88.74%, glass containers: 95.38%, wood: 68.42%) outperforms state-of-the-art methods.</p>\",\"PeriodicalId\":13303,\"journal\":{\"name\":\"IEEE transactions on neural networks and learning systems\",\"volume\":\"PP \",\"pages\":\"\"},\"PeriodicalIF\":10.2000,\"publicationDate\":\"2024-10-28\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE transactions on neural networks and learning systems\",\"FirstCategoryId\":\"94\",\"ListUrlMain\":\"https://doi.org/10.1109/TNNLS.2024.3479734\",\"RegionNum\":1,\"RegionCategory\":\"计算机科学\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q1\",\"JCRName\":\"COMPUTER SCIENCE, ARTIFICIAL INTELLIGENCE\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE transactions on neural networks and learning systems","FirstCategoryId":"94","ListUrlMain":"https://doi.org/10.1109/TNNLS.2024.3479734","RegionNum":1,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"COMPUTER SCIENCE, ARTIFICIAL INTELLIGENCE","Score":null,"Total":0}
Representation Learning Based on Co-Evolutionary Combined With Probability Distribution Optimization for Precise Defect Location.
Visual defect detection methods based on representation learning play an important role in industrial scenarios. Defect detection technology based on representation learning has made significant progress. However, existing defect detection methods still face three challenges: first, the extreme scarcity of industrial defect samples makes training difficult. Second, due to the characteristics of industrial defects, such as blur and background interference, it is challenging to obtain fuzzy defect separation edges and context information. Third, industrial defects cannot obtain accurate positioning information. This article proposes feature co-evolution interaction architecture (CIA) and glass container defect dataset to address the above challenges. Specifically, the contributions of this article are as follows: first, this article designs a glass container image acquisition system that combines RGB and polarization information to create a glass container defect dataset containing more than 60 000 samples to alleviate the sample scarcity problem in industrial scenarios. Subsequently, this article designs the CIA. CIA optimizes the probability distribution of features through the co-evolution of edge and context features, thereby improving detection accuracy in blurred defects and noisy environments. Finally, this article proposes a novel inforced IoU loss (IIoU loss), which can obtain more accurate position information by being aware of the scale changes of the predicted box. Defect detection experiments in three mainstream industrial manufacturing categories (Northeastern University (NEU)-Det, glass containers, wood) show that CIA only uses 22.5 GFLOPs, and mean average precision (mAP) (NEU-Det: 88.74%, glass containers: 95.38%, wood: 68.42%) outperforms state-of-the-art methods.
期刊介绍:
The focus of IEEE Transactions on Neural Networks and Learning Systems is to present scholarly articles discussing the theory, design, and applications of neural networks as well as other learning systems. The journal primarily highlights technical and scientific research in this domain.