Jie Cheng , Yaran Lv , Fan Zhang , Peng Han , Qinhua Miao , Zhenxiang Huang
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引用次数: 0
摘要
钴正在成为取代铜的下一代互连材料,用于 10 纳米以下技术节点的集成电路。由于钴易腐蚀,在化学机械抛光(CMP)过程中确定有效的钴腐蚀抑制剂至关重要。本研究采用理论计算和实验方法研究了苯并三唑(BTA)及其衍生物-甲基苯并三唑(TTA)和 5-羧基苯并三唑对 Co 表面的缓蚀效果。量子化学计算和分子动力学模拟用于揭示原子水平的腐蚀机理。电化学实验进一步验证了计算结果。在所研究的抑制剂中,TTA 对 Co 表面的吸附亲和力最高,抑制效率高达 91.71%。这是因为通过分子间作用力的物理吸附和电荷转移的化学吸附,在 Co 表面形成了一层致密的保护层。CMP 实验表明,这三种抑制剂都能显著降低 Co 的材料去除率 (MRR),尤其是当 TTA 浓度达到 9 mM 时,MRR 降至 132.64 nm/min,满足了 Co 的批量抛光要求。这些研究结果表明,TTA 是一种非常有前途的 Co 腐蚀抑制剂,可用于 CMP 工艺中的浆料开发。
Understanding the adsorption mechanism of benzotriazole and its derivatives as effective corrosion inhibitors for cobalt in chemical mechanical polishing
Cobalt is emerging as the next-generation interconnect material to replace copper for integrated circuit sub-10 nm technology nodes. Due to its susceptibility to corrosion, identifying effective corrosion inhibitors for Co during the chemical mechanical polishing (CMP) is crucial. In this study, theoretical computations and experimental approaches were employed to investigate the corrosion inhibition effects of benzotriazole (BTA) and its derivatives—methylbenzotriazole (TTA) and 5-carboxybenzotriazole—on Co surfaces. Quantum chemical calculations and molecular dynamics simulations were used to reveal the corrosion mechanism at the atomic level. The computational findings were further validated by electrochemical experiments. Among the inhibitors studied, TTA exhibited the highest adsorption affinity for the Co surface, achieving an inhibition efficiency of up to 91.71 %. This is attributed to the formation of a dense protective layer on the Co surface through both physical adsorption via intermolecular forces and chemical adsorption via charge transfer. CMP experiments demonstrated that all three inhibitors significantly reduce the material removal rate (MRR) of Co. Notably, when the TTA concentration reaches 9 mM, the MRR is reduced to 132.64 nm/min, meeting the requirements for Co bulk polishing. These findings suggest that TTA is a highly promising Co corrosion inhibitor for slurry development in CMP processes.
期刊介绍:
Applied Surface Science covers topics contributing to a better understanding of surfaces, interfaces, nanostructures and their applications. The journal is concerned with scientific research on the atomic and molecular level of material properties determined with specific surface analytical techniques and/or computational methods, as well as the processing of such structures.