Manikanta Makala, Maciej Barłóg, Derek Dremann, Salahuddin Attar, Edgar Gutiérrez Fernández, Mohammed Al-Hashimi and Oana D. Jurchescu
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引用次数: 0
摘要
开发同时具有高性能和高稳定性的有机场效应晶体管(OFET),对于基于有机半导体的互补集成电路和其他应用至关重要。虽然在增强 p 沟道器件方面取得了进展,但设计具有竞争力的 n 型有机晶体管仍然是一个巨大的障碍。在本文中,我们展示了通过创新的器件和材料工程,实现了具有前所未有的工作稳定性的高移动性 n 型 OFET。在基于茚并二噻唑(IDTz)和二酮吡咯并吡咯(DPP)单元的供体-受体聚合物上制造的薄膜晶体管,电子迁移率高达 1.3 cm2 V-1 s-1,同时迁移率的变化可以忽略不计,在栅源和漏源电压均为 60 V 的持续偏压应力下,阈值电压偏移低至 0.5 V,持续时间超过 1000 分钟。这些非凡的特性使我们的 OFET 成为 p 型晶体管的强大对手,从而解决了该领域长期存在的难题。
High-performance n-type polymer field-effect transistors with exceptional stability†
Development of organic field-effect transistors (OFETs) that simultaneously exhibit high-performance and high-stability is critical for complementary integrated circuits and other applications based on organic semiconductors. While progress has been made in enhancing p-channel devices, engineering competitive n-type organic transistors remains a formidable obstacle. Herein, we demonstrate the achievement of high-mobility n-type OFETs with unprecedented operational stability through innovative device and material engineering. Thin film transistors fabricated on donor–acceptor polymers based on indacenodithiazole (IDTz) and diketopyrrolopyrrole (DPP) units exhibit electron mobilities up to 1.3 cm2 V−1 s−1, along with a negligible change in mobility, and threshold voltage shift as low as 0.5 V under continuous bias stress of 60 V for both the gate-source and drain-source voltages persisting for more than 1000 min. These remarkable properties position our OFETs as formidable counterparts to p-type transistors, addressing a longstanding challenge in the field.
期刊介绍:
ACS Applied Materials & Interfaces is a leading interdisciplinary journal that brings together chemists, engineers, physicists, and biologists to explore the development and utilization of newly-discovered materials and interfacial processes for specific applications. Our journal has experienced remarkable growth since its establishment in 2009, both in terms of the number of articles published and the impact of the research showcased. We are proud to foster a truly global community, with the majority of published articles originating from outside the United States, reflecting the rapid growth of applied research worldwide.