{"title":"基于 Ps-LIBS 技术的镍铬合金纳米薄膜多维分析","authors":"Yingying Liu , Chuanqi Wu , Lili Dong , Junshan Xiu","doi":"10.1016/j.sab.2024.107062","DOIUrl":null,"url":null,"abstract":"<div><div>With the rapid development of thin film materials, Ni<img>Cr alloy nanofilms have a very wide range of applications in many fields due to their excellent properties. In this paper, Ni<img>Cr alloy nanofilms with different Ni<img>Cr content ratios were prepared using electron beam evaporation technology. The calibration curves of the Ni / Cr content ratio and the corresponding spectral line intensity ratio of the thin film samples were plotted. The linear fitting coefficient (RZhou and Tian (2005) [<span><span>2</span></span>]) of this calibration curve reached 0.99, which had a good linear fitting degree. The quantitative analysis of Ni<img>Cr alloy thin film samples was carried out by Picosecond Laser Induced Breakdown Spectroscopy (Ps-LIBS). Calculated using the Boltzmann method and the Stark broadening method, the plasma electron temperature (T) was about 7048 K and the electron density (Ne) was about 6.08 × 10<sup>16</sup> cm<sup>−3</sup>, and then the plasma characteristics of Ps-LIBS technology were preliminarily studied. In order to further realize the analysis of thin film samples, the depth profile of thin film samples was preliminary analyzed using the Ps-LIIBS technology and the thickness of a single laser pulse ablation was about 75 nm, which could be used to evaluate the thickness of the thin films. All the results show that Ps-LIBS technology can be used to realize the quantitative and quantitative analyses of Ni<img>Cr alloy nanofilms prepared using the electron beam evaporation technology, which provides technical support for exploring the application potential of Ni<img>Cr alloy nanofilms in practice.</div></div>","PeriodicalId":21890,"journal":{"name":"Spectrochimica Acta Part B: Atomic Spectroscopy","volume":"222 ","pages":"Article 107062"},"PeriodicalIF":3.2000,"publicationDate":"2024-10-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Multi-dimensional analysis of NiCr alloy nanofilms based on Ps-LIBS technology\",\"authors\":\"Yingying Liu , Chuanqi Wu , Lili Dong , Junshan Xiu\",\"doi\":\"10.1016/j.sab.2024.107062\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><div>With the rapid development of thin film materials, Ni<img>Cr alloy nanofilms have a very wide range of applications in many fields due to their excellent properties. In this paper, Ni<img>Cr alloy nanofilms with different Ni<img>Cr content ratios were prepared using electron beam evaporation technology. The calibration curves of the Ni / Cr content ratio and the corresponding spectral line intensity ratio of the thin film samples were plotted. The linear fitting coefficient (RZhou and Tian (2005) [<span><span>2</span></span>]) of this calibration curve reached 0.99, which had a good linear fitting degree. The quantitative analysis of Ni<img>Cr alloy thin film samples was carried out by Picosecond Laser Induced Breakdown Spectroscopy (Ps-LIBS). Calculated using the Boltzmann method and the Stark broadening method, the plasma electron temperature (T) was about 7048 K and the electron density (Ne) was about 6.08 × 10<sup>16</sup> cm<sup>−3</sup>, and then the plasma characteristics of Ps-LIBS technology were preliminarily studied. In order to further realize the analysis of thin film samples, the depth profile of thin film samples was preliminary analyzed using the Ps-LIIBS technology and the thickness of a single laser pulse ablation was about 75 nm, which could be used to evaluate the thickness of the thin films. All the results show that Ps-LIBS technology can be used to realize the quantitative and quantitative analyses of Ni<img>Cr alloy nanofilms prepared using the electron beam evaporation technology, which provides technical support for exploring the application potential of Ni<img>Cr alloy nanofilms in practice.</div></div>\",\"PeriodicalId\":21890,\"journal\":{\"name\":\"Spectrochimica Acta Part B: Atomic Spectroscopy\",\"volume\":\"222 \",\"pages\":\"Article 107062\"},\"PeriodicalIF\":3.2000,\"publicationDate\":\"2024-10-31\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Spectrochimica Acta Part B: Atomic Spectroscopy\",\"FirstCategoryId\":\"92\",\"ListUrlMain\":\"https://www.sciencedirect.com/science/article/pii/S0584854724002076\",\"RegionNum\":2,\"RegionCategory\":\"化学\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q1\",\"JCRName\":\"SPECTROSCOPY\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Spectrochimica Acta Part B: Atomic Spectroscopy","FirstCategoryId":"92","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0584854724002076","RegionNum":2,"RegionCategory":"化学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"SPECTROSCOPY","Score":null,"Total":0}
Multi-dimensional analysis of NiCr alloy nanofilms based on Ps-LIBS technology
With the rapid development of thin film materials, NiCr alloy nanofilms have a very wide range of applications in many fields due to their excellent properties. In this paper, NiCr alloy nanofilms with different NiCr content ratios were prepared using electron beam evaporation technology. The calibration curves of the Ni / Cr content ratio and the corresponding spectral line intensity ratio of the thin film samples were plotted. The linear fitting coefficient (RZhou and Tian (2005) [2]) of this calibration curve reached 0.99, which had a good linear fitting degree. The quantitative analysis of NiCr alloy thin film samples was carried out by Picosecond Laser Induced Breakdown Spectroscopy (Ps-LIBS). Calculated using the Boltzmann method and the Stark broadening method, the plasma electron temperature (T) was about 7048 K and the electron density (Ne) was about 6.08 × 1016 cm−3, and then the plasma characteristics of Ps-LIBS technology were preliminarily studied. In order to further realize the analysis of thin film samples, the depth profile of thin film samples was preliminary analyzed using the Ps-LIIBS technology and the thickness of a single laser pulse ablation was about 75 nm, which could be used to evaluate the thickness of the thin films. All the results show that Ps-LIBS technology can be used to realize the quantitative and quantitative analyses of NiCr alloy nanofilms prepared using the electron beam evaporation technology, which provides technical support for exploring the application potential of NiCr alloy nanofilms in practice.
期刊介绍：
Spectrochimica Acta Part B: Atomic Spectroscopy, is intended for the rapid publication of both original work and reviews in the following fields:
Atomic Emission (AES), Atomic Absorption (AAS) and Atomic Fluorescence (AFS) spectroscopy;
Mass Spectrometry (MS) for inorganic analysis covering Spark Source (SS-MS), Inductively Coupled Plasma (ICP-MS), Glow Discharge (GD-MS), and Secondary Ion Mass Spectrometry (SIMS).
Laser induced atomic spectroscopy for inorganic analysis, including non-linear optical laser spectroscopy, covering Laser Enhanced Ionization (LEI), Laser Induced Fluorescence (LIF), Resonance Ionization Spectroscopy (RIS) and Resonance Ionization Mass Spectrometry (RIMS); Laser Induced Breakdown Spectroscopy (LIBS); Cavity Ringdown Spectroscopy (CRDS), Laser Ablation Inductively Coupled Plasma Atomic Emission Spectroscopy (LA-ICP-AES) and Laser Ablation Inductively Coupled Plasma Mass Spectrometry (LA-ICP-MS).
X-ray spectrometry, X-ray Optics and Microanalysis, including X-ray fluorescence spectrometry (XRF) and related techniques, in particular Total-reflection X-ray Fluorescence Spectrometry (TXRF), and Synchrotron Radiation-excited Total reflection XRF (SR-TXRF).
Manuscripts dealing with (i) fundamentals, (ii) methodology development, (iii)instrumentation, and (iv) applications, can be submitted for publication.
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