Jin Cheng;Yunpeng Zhang;Jiawei Long;Chengyong Yu;Chong Gao;Hu Zheng;En Li;Lin Qin;Xiangbao Zhu
{"title":"利用新型多通道耦合开放式谐振器测量 0.11-0.27 太赫兹的复导率","authors":"Jin Cheng;Yunpeng Zhang;Jiawei Long;Chengyong Yu;Chong Gao;Hu Zheng;En Li;Lin Qin;Xiangbao Zhu","doi":"10.1109/LMWT.2024.3437422","DOIUrl":null,"url":null,"abstract":"In this letter, a novel multichannel-coupled open resonator for terahertz (THz) wider frequency range measurement is proposed. The coupling of the THz open resonator is carried out through the cooperation between the PCB coupling sheet and the pressurized flange. The operating frequency of the resonator is extended through the multichannel coupling technology under one cavity. Moreover, an improved plane mirror with a slit and an inspiratory structure is designed to enhance the stability of measurement in the THz range. The proposed system and method are of great significance for characterizing the dielectric property frequency dependence of materials in the THz range.","PeriodicalId":73297,"journal":{"name":"IEEE microwave and wireless technology letters","volume":"34 11","pages":"1297-1300"},"PeriodicalIF":0.0000,"publicationDate":"2024-09-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Measurement of Complex Permittivity in 0.11–0.27 THz With a Novel Multichannel-Coupled Open Resonator\",\"authors\":\"Jin Cheng;Yunpeng Zhang;Jiawei Long;Chengyong Yu;Chong Gao;Hu Zheng;En Li;Lin Qin;Xiangbao Zhu\",\"doi\":\"10.1109/LMWT.2024.3437422\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this letter, a novel multichannel-coupled open resonator for terahertz (THz) wider frequency range measurement is proposed. The coupling of the THz open resonator is carried out through the cooperation between the PCB coupling sheet and the pressurized flange. The operating frequency of the resonator is extended through the multichannel coupling technology under one cavity. Moreover, an improved plane mirror with a slit and an inspiratory structure is designed to enhance the stability of measurement in the THz range. The proposed system and method are of great significance for characterizing the dielectric property frequency dependence of materials in the THz range.\",\"PeriodicalId\":73297,\"journal\":{\"name\":\"IEEE microwave and wireless technology letters\",\"volume\":\"34 11\",\"pages\":\"1297-1300\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2024-09-16\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE microwave and wireless technology letters\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://ieeexplore.ieee.org/document/10681218/\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"0\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE microwave and wireless technology letters","FirstCategoryId":"1085","ListUrlMain":"https://ieeexplore.ieee.org/document/10681218/","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"0","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
Measurement of Complex Permittivity in 0.11–0.27 THz With a Novel Multichannel-Coupled Open Resonator
In this letter, a novel multichannel-coupled open resonator for terahertz (THz) wider frequency range measurement is proposed. The coupling of the THz open resonator is carried out through the cooperation between the PCB coupling sheet and the pressurized flange. The operating frequency of the resonator is extended through the multichannel coupling technology under one cavity. Moreover, an improved plane mirror with a slit and an inspiratory structure is designed to enhance the stability of measurement in the THz range. The proposed system and method are of great significance for characterizing the dielectric property frequency dependence of materials in the THz range.