{"title":"基于数字本底线性校准的 DR 无损耗抖动技术,用于具有数字输入干扰消除功能的 SAR 辅助多级 ADC","authors":"Lizhen Zhang;Bo Gao;Kun-Woo Park;Kent Edrian Lozada;Raymond Mabilangan;Hyeongjin Kim;Jianhui Wu;Seung-Tak Ryu","doi":"10.1109/OJCAS.2024.3486809","DOIUrl":null,"url":null,"abstract":"In this paper, we propose a correlation-based background linearity calibration technique to digitally correct the bit weights in successive approximation register (SAR)-assisted analog-to-digital converters (ADCs). Unlike typical dithering-based calibration techniques in which signal dynamic range (DR) is unavoidably reduced, in this work, a small dither signal is injected into the input path by a simple switching scheme. The associated DR loss is avoided by the back-end redundancy. We also describe a capacitor-scanning dither method to accomplish simultaneous and independent identification of multiple bit weights. In addition, a digital-domain input-interference cancellation (IIC) technique is proposed to accelerate the convergence speed of the correlation-based calibration. The proposed calibration and acceleration techniques are analyzed by using both theoretical formulation and system simulation. The simulation results are presented with a 12-bit SAR-assisted two-stage pipeline ADC model. Owing to our proposed calibration, the spurious-free dynamic range (SFDR) increased from 60.1 to 84.8 dB and the signal to noise and distortion ratio (SNDR) improved from 55.4 to 72.5 dB. By comparing the cases with and without the proposed IIC technique, a \n<inline-formula> <tex-math>$50\\times $ </tex-math></inline-formula>\n reduction in convergence cycle could be achieved. The proposed calibration technique can be utilized to overcome the inherent DAC mismatch and residue gain errors to implement high-linearity ADCs, such as SAR-assisted ADCs in many different applications.","PeriodicalId":93442,"journal":{"name":"IEEE open journal of circuits and systems","volume":"5 ","pages":"349-364"},"PeriodicalIF":2.4000,"publicationDate":"2024-10-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10736969","citationCount":"0","resultStr":"{\"title\":\"DR Loss-Free Dithering-Based Digital Background Linearity Calibration for SAR-Assisted Multi-Stage ADCs With Digital Input-Interference Cancellation\",\"authors\":\"Lizhen Zhang;Bo Gao;Kun-Woo Park;Kent Edrian Lozada;Raymond Mabilangan;Hyeongjin Kim;Jianhui Wu;Seung-Tak Ryu\",\"doi\":\"10.1109/OJCAS.2024.3486809\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper, we propose a correlation-based background linearity calibration technique to digitally correct the bit weights in successive approximation register (SAR)-assisted analog-to-digital converters (ADCs). Unlike typical dithering-based calibration techniques in which signal dynamic range (DR) is unavoidably reduced, in this work, a small dither signal is injected into the input path by a simple switching scheme. The associated DR loss is avoided by the back-end redundancy. We also describe a capacitor-scanning dither method to accomplish simultaneous and independent identification of multiple bit weights. In addition, a digital-domain input-interference cancellation (IIC) technique is proposed to accelerate the convergence speed of the correlation-based calibration. The proposed calibration and acceleration techniques are analyzed by using both theoretical formulation and system simulation. The simulation results are presented with a 12-bit SAR-assisted two-stage pipeline ADC model. Owing to our proposed calibration, the spurious-free dynamic range (SFDR) increased from 60.1 to 84.8 dB and the signal to noise and distortion ratio (SNDR) improved from 55.4 to 72.5 dB. By comparing the cases with and without the proposed IIC technique, a \\n<inline-formula> <tex-math>$50\\\\times $ </tex-math></inline-formula>\\n reduction in convergence cycle could be achieved. The proposed calibration technique can be utilized to overcome the inherent DAC mismatch and residue gain errors to implement high-linearity ADCs, such as SAR-assisted ADCs in many different applications.\",\"PeriodicalId\":93442,\"journal\":{\"name\":\"IEEE open journal of circuits and systems\",\"volume\":\"5 \",\"pages\":\"349-364\"},\"PeriodicalIF\":2.4000,\"publicationDate\":\"2024-10-28\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10736969\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE open journal of circuits and systems\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://ieeexplore.ieee.org/document/10736969/\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q2\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE open journal of circuits and systems","FirstCategoryId":"1085","ListUrlMain":"https://ieeexplore.ieee.org/document/10736969/","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
摘要
本文提出了一种基于相关性的背景线性度校准技术,用于对逐次逼近寄存器(SAR)辅助模数转换器(ADC)中的位权进行数字校正。在典型的基于抖动的校准技术中,信号的动态范围(DR)不可避免地会减小,而在这项工作中,通过简单的切换方案将一个小的抖动信号注入到输入路径中。后端冗余避免了相关的 DR 损失。我们还介绍了一种电容扫描抖动方法,可同时独立识别多个比特权重。此外,我们还提出了一种数字域输入干扰消除(IIC)技术,以加快基于相关性校准的收敛速度。通过理论表述和系统仿真分析了所提出的校准和加速技术。仿真结果是通过一个 12 位 SAR 辅助两级流水线 ADC 模型得出的。由于采用了我们提出的校准方法,无杂散动态范围 (SFDR) 从 60.1 dB 提高到 84.8 dB,信噪比和失真比 (SNDR) 从 55.4 dB 提高到 72.5 dB。通过比较使用和不使用所提出的 IIC 技术的情况,收敛周期可减少 50 倍。所提出的校准技术可用于克服固有的 DAC 失配和残差增益误差,以实现高线性度 ADC,如许多不同应用中的 SAR 辅助 ADC。
DR Loss-Free Dithering-Based Digital Background Linearity Calibration for SAR-Assisted Multi-Stage ADCs With Digital Input-Interference Cancellation
In this paper, we propose a correlation-based background linearity calibration technique to digitally correct the bit weights in successive approximation register (SAR)-assisted analog-to-digital converters (ADCs). Unlike typical dithering-based calibration techniques in which signal dynamic range (DR) is unavoidably reduced, in this work, a small dither signal is injected into the input path by a simple switching scheme. The associated DR loss is avoided by the back-end redundancy. We also describe a capacitor-scanning dither method to accomplish simultaneous and independent identification of multiple bit weights. In addition, a digital-domain input-interference cancellation (IIC) technique is proposed to accelerate the convergence speed of the correlation-based calibration. The proposed calibration and acceleration techniques are analyzed by using both theoretical formulation and system simulation. The simulation results are presented with a 12-bit SAR-assisted two-stage pipeline ADC model. Owing to our proposed calibration, the spurious-free dynamic range (SFDR) increased from 60.1 to 84.8 dB and the signal to noise and distortion ratio (SNDR) improved from 55.4 to 72.5 dB. By comparing the cases with and without the proposed IIC technique, a
$50\times $
reduction in convergence cycle could be achieved. The proposed calibration technique can be utilized to overcome the inherent DAC mismatch and residue gain errors to implement high-linearity ADCs, such as SAR-assisted ADCs in many different applications.