{"title":"电子速度调制对氮化铝/氮化镓高频晶体管微波功率性能的影响","authors":"Mingyan Wang, Yuanjie Lv, Heng Zhou, Chao Liu, Peng Cui, Zhaojun Lin","doi":"10.1063/5.0222095","DOIUrl":null,"url":null,"abstract":"In this study, we demonstrate the effects of electron velocity modulation (Δve/ΔVgs) on the microwave power performance for AlGaN/GaN HFETs. In order to conduct the experiments, AlGaN/GaN HFETs with gate lengths ranging from 500 to 80 nm were fabricated. Electron transport was investigated by coupling a drift-diffusion solver with the Monte Carlo method. As gate lengths (Lg) varied from 500 to 200 nm, the increased polarization Coulomb field scattering led to an increase in Δve/ΔVgs and the stronger electric field (E) increased ve and enhanced the transconductance (gm), which in turn led to a greater power gain (Gp) in the HFETs. The higher power output (Pout) was also due to the increased ve that boosted the saturated output current (Ids,sat). The unique phenomenon that occurs from electron velocity modulation of AlGaN/GaN HFETs at electron densities (ns) < 3.42 × 1012cm−2 can be used as an effective mechanism to enhance the power gain of AlGaN/GaN HFETs.","PeriodicalId":8094,"journal":{"name":"Applied Physics Letters","volume":null,"pages":null},"PeriodicalIF":3.5000,"publicationDate":"2024-11-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Impact of electron velocity modulation on microwave power performance for AlGaN/GaN HFETs\",\"authors\":\"Mingyan Wang, Yuanjie Lv, Heng Zhou, Chao Liu, Peng Cui, Zhaojun Lin\",\"doi\":\"10.1063/5.0222095\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this study, we demonstrate the effects of electron velocity modulation (Δve/ΔVgs) on the microwave power performance for AlGaN/GaN HFETs. In order to conduct the experiments, AlGaN/GaN HFETs with gate lengths ranging from 500 to 80 nm were fabricated. Electron transport was investigated by coupling a drift-diffusion solver with the Monte Carlo method. As gate lengths (Lg) varied from 500 to 200 nm, the increased polarization Coulomb field scattering led to an increase in Δve/ΔVgs and the stronger electric field (E) increased ve and enhanced the transconductance (gm), which in turn led to a greater power gain (Gp) in the HFETs. The higher power output (Pout) was also due to the increased ve that boosted the saturated output current (Ids,sat). The unique phenomenon that occurs from electron velocity modulation of AlGaN/GaN HFETs at electron densities (ns) < 3.42 × 1012cm−2 can be used as an effective mechanism to enhance the power gain of AlGaN/GaN HFETs.\",\"PeriodicalId\":8094,\"journal\":{\"name\":\"Applied Physics Letters\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":3.5000,\"publicationDate\":\"2024-11-13\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Applied Physics Letters\",\"FirstCategoryId\":\"101\",\"ListUrlMain\":\"https://doi.org/10.1063/5.0222095\",\"RegionNum\":2,\"RegionCategory\":\"物理与天体物理\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q2\",\"JCRName\":\"PHYSICS, APPLIED\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Applied Physics Letters","FirstCategoryId":"101","ListUrlMain":"https://doi.org/10.1063/5.0222095","RegionNum":2,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"PHYSICS, APPLIED","Score":null,"Total":0}
Impact of electron velocity modulation on microwave power performance for AlGaN/GaN HFETs
In this study, we demonstrate the effects of electron velocity modulation (Δve/ΔVgs) on the microwave power performance for AlGaN/GaN HFETs. In order to conduct the experiments, AlGaN/GaN HFETs with gate lengths ranging from 500 to 80 nm were fabricated. Electron transport was investigated by coupling a drift-diffusion solver with the Monte Carlo method. As gate lengths (Lg) varied from 500 to 200 nm, the increased polarization Coulomb field scattering led to an increase in Δve/ΔVgs and the stronger electric field (E) increased ve and enhanced the transconductance (gm), which in turn led to a greater power gain (Gp) in the HFETs. The higher power output (Pout) was also due to the increased ve that boosted the saturated output current (Ids,sat). The unique phenomenon that occurs from electron velocity modulation of AlGaN/GaN HFETs at electron densities (ns) < 3.42 × 1012cm−2 can be used as an effective mechanism to enhance the power gain of AlGaN/GaN HFETs.
期刊介绍:
Applied Physics Letters (APL) features concise, up-to-date reports on significant new findings in applied physics. Emphasizing rapid dissemination of key data and new physical insights, APL offers prompt publication of new experimental and theoretical papers reporting applications of physics phenomena to all branches of science, engineering, and modern technology.
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