对聚合物基底上的刚性非均质层进行原子力显微镜纳米压痕。

IF 2 3区 工程技术 Q2 ANATOMY & MORPHOLOGY Microscopy Research and Technique Pub Date : 2024-11-14 DOI:10.1002/jemt.24734
Ilya A Morozov, Anton Yu Beliaev, Alexander S Kamenetskikh
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引用次数: 0

摘要

分析异质材料的压痕数据,特别是弹性基底上的层,需要接触面积的信息,这对计算机械性能至关重要。原子力显微镜尖端的实际形状并不能用简单的旋转体来描述。在这项工作中,使用有限元方法研究了截锥形针尖在超弹性基底上对坚硬层的压痕。针尖的尺寸、弹性模量和层的厚度均有变化。得到的载荷和接触面积与压痕深度的关系模型被用于分析原子力显微镜对聚氨酯表面硬质不均匀纳米层压痕的实验数据。研究了层的厚度和弹性模量以及表面的断裂特性。所得结果可用于研究弹性基底上柔性薄膜的机械性能和断裂韧性。
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AFM Nanoindentation of Stiff Inhomogeneous Layer on Polymeric Substrate.

Analysis of indentation data of heterogeneous material, in particular, layer on an elastic substrate requires information about the contact area that is essential for calculating mechanical properties. The actual shape of the AFM-tip is not described by simple body of revolution. In this work, the indentation of a stiff layer on a hyperelastic substrate by a truncated conical tip is studied using finite element methods. The size of the tip, elastic modulus, and thickness of the layer are varied. The obtained model dependences of loading and contact area versus the depth of indentation are used in analysis of the experimental data of AFM indentation of stiff inhomogeneous nanolayers of polyurethane surface. Thickness and elastic modulus of the layers, fracture properties of the surface are studied. The obtained results can find application in the study of mechanical properties and fracture toughness of thin flexible films on an elastic substrate.

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来源期刊
Microscopy Research and Technique
Microscopy Research and Technique 医学-解剖学与形态学
CiteScore
5.30
自引率
20.00%
发文量
233
审稿时长
4.7 months
期刊介绍: Microscopy Research and Technique (MRT) publishes articles on all aspects of advanced microscopy original architecture and methodologies with applications in the biological, clinical, chemical, and materials sciences. Original basic and applied research as well as technical papers dealing with the various subsets of microscopy are encouraged. MRT is the right form for those developing new microscopy methods or using the microscope to answer key questions in basic and applied research.
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