Xuan Li , Hongru Li , Hao Wei , Sha Wang , Songsong Zhu , Nan Jiang , Chao Yang , Guoliang Deng
{"title":"边缘投影轮廓测量中的改进型四元互补格雷码相位解除方法","authors":"Xuan Li , Hongru Li , Hao Wei , Sha Wang , Songsong Zhu , Nan Jiang , Chao Yang , Guoliang Deng","doi":"10.1016/j.optlaseng.2024.108680","DOIUrl":null,"url":null,"abstract":"<div><div>This paper presents a phase unwrapping method utilizing an improved quaternary complementary Gray code in fringe projection profilometry. Traditional methods often require a high number of additional projection patterns, which are aimed to be minimized. The proposed approach decomposes the last quaternary Gray code pattern into two binary Gray codes, integrating a complementary strategy for error prevention. This method enhances the accuracy of order calculation while retaining the efficiency of the quaternary Gray code. To obtain the codewords corresponding to the four grayscale levels more conveniently and accurately, a point-to-point threshold segmentation strategy is introduced to enhance segmentation. Additionally, an isolated order correction strategy is proposed to mitigate noise-induced errors. Experimental results validate the feasibility and superiority of the method over conventional techniques, demonstrating its improved efficiency and robustness.</div></div>","PeriodicalId":49719,"journal":{"name":"Optics and Lasers in Engineering","volume":"184 ","pages":"Article 108680"},"PeriodicalIF":3.5000,"publicationDate":"2024-11-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"An improved quaternary complementary Gray code phase unwrapping method in fringe projection profilometry\",\"authors\":\"Xuan Li , Hongru Li , Hao Wei , Sha Wang , Songsong Zhu , Nan Jiang , Chao Yang , Guoliang Deng\",\"doi\":\"10.1016/j.optlaseng.2024.108680\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><div>This paper presents a phase unwrapping method utilizing an improved quaternary complementary Gray code in fringe projection profilometry. Traditional methods often require a high number of additional projection patterns, which are aimed to be minimized. The proposed approach decomposes the last quaternary Gray code pattern into two binary Gray codes, integrating a complementary strategy for error prevention. This method enhances the accuracy of order calculation while retaining the efficiency of the quaternary Gray code. To obtain the codewords corresponding to the four grayscale levels more conveniently and accurately, a point-to-point threshold segmentation strategy is introduced to enhance segmentation. Additionally, an isolated order correction strategy is proposed to mitigate noise-induced errors. Experimental results validate the feasibility and superiority of the method over conventional techniques, demonstrating its improved efficiency and robustness.</div></div>\",\"PeriodicalId\":49719,\"journal\":{\"name\":\"Optics and Lasers in Engineering\",\"volume\":\"184 \",\"pages\":\"Article 108680\"},\"PeriodicalIF\":3.5000,\"publicationDate\":\"2024-11-08\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Optics and Lasers in Engineering\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://www.sciencedirect.com/science/article/pii/S0143816624006584\",\"RegionNum\":2,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q2\",\"JCRName\":\"OPTICS\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Optics and Lasers in Engineering","FirstCategoryId":"5","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0143816624006584","RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"OPTICS","Score":null,"Total":0}
An improved quaternary complementary Gray code phase unwrapping method in fringe projection profilometry
This paper presents a phase unwrapping method utilizing an improved quaternary complementary Gray code in fringe projection profilometry. Traditional methods often require a high number of additional projection patterns, which are aimed to be minimized. The proposed approach decomposes the last quaternary Gray code pattern into two binary Gray codes, integrating a complementary strategy for error prevention. This method enhances the accuracy of order calculation while retaining the efficiency of the quaternary Gray code. To obtain the codewords corresponding to the four grayscale levels more conveniently and accurately, a point-to-point threshold segmentation strategy is introduced to enhance segmentation. Additionally, an isolated order correction strategy is proposed to mitigate noise-induced errors. Experimental results validate the feasibility and superiority of the method over conventional techniques, demonstrating its improved efficiency and robustness.
期刊介绍:
Optics and Lasers in Engineering aims at providing an international forum for the interchange of information on the development of optical techniques and laser technology in engineering. Emphasis is placed on contributions targeted at the practical use of methods and devices, the development and enhancement of solutions and new theoretical concepts for experimental methods.
Optics and Lasers in Engineering reflects the main areas in which optical methods are being used and developed for an engineering environment. Manuscripts should offer clear evidence of novelty and significance. Papers focusing on parameter optimization or computational issues are not suitable. Similarly, papers focussed on an application rather than the optical method fall outside the journal''s scope. The scope of the journal is defined to include the following:
-Optical Metrology-
Optical Methods for 3D visualization and virtual engineering-
Optical Techniques for Microsystems-
Imaging, Microscopy and Adaptive Optics-
Computational Imaging-
Laser methods in manufacturing-
Integrated optical and photonic sensors-
Optics and Photonics in Life Science-
Hyperspectral and spectroscopic methods-
Infrared and Terahertz techniques