仪器与测量学会

{"title":"仪器与测量学会","authors":"","doi":"10.1109/OJIM.2024.3505992","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":100630,"journal":{"name":"IEEE Open Journal of Instrumentation and Measurement","volume":"3 ","pages":"C2-C2"},"PeriodicalIF":0.0000,"publicationDate":"2024-12-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10817081","citationCount":"0","resultStr":"{\"title\":\"IEEE Instrumentation and Measurement Society\",\"authors\":\"\",\"doi\":\"10.1109/OJIM.2024.3505992\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":100630,\"journal\":{\"name\":\"IEEE Open Journal of Instrumentation and Measurement\",\"volume\":\"3 \",\"pages\":\"C2-C2\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2024-12-27\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10817081\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE Open Journal of Instrumentation and Measurement\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://ieeexplore.ieee.org/document/10817081/\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Open Journal of Instrumentation and Measurement","FirstCategoryId":"1085","ListUrlMain":"https://ieeexplore.ieee.org/document/10817081/","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}