Pub Date : 2025-02-12DOI: 10.1109/OJIM.2025.3527536
Baoqiang Du;Yangfan Su;Zerui Yang
To meet the requirements of high-precision measurement of time-frequency multiparameters, a high-accuracy frequency standard comparison technology combining adaptive frequency and Lissajous figure is proposed. This technology uses only one reference frequency source to realize the frequency standard comparison and frequency measurement between any frequency signals without frequency normalization. First, a new frequency standard comparison signal is obtained by using an adaptive frequency standard generation module to roughly measure the measured frequency. Second, the turning period is measured by observing the Lissajous figure. Third, via the turning period and the function relation of frequency deviation, the relative frequency difference between the measured and frequency standard signals can be obtained. Finally, the phase relation between the measured and frequency standard signals is determined by oscilloscope, and then the high-accuracy measurement of the measured frequency can be realized. The testing results indicate that the accuracy of the frequency measurement in the radiofrequency range can achieve the $10^{-12}$ order of magnitude. Compared with the traditional frequency standard comparison technology, this technology has many characteristics, such as simple operation, low cost, low noise, and high measurement accuracy.
{"title":"High-Accuracy Frequency Standard Comparison Technology Combining Adaptive Frequency and Lissajous Figure","authors":"Baoqiang Du;Yangfan Su;Zerui Yang","doi":"10.1109/OJIM.2025.3527536","DOIUrl":"https://doi.org/10.1109/OJIM.2025.3527536","url":null,"abstract":"To meet the requirements of high-precision measurement of time-frequency multiparameters, a high-accuracy frequency standard comparison technology combining adaptive frequency and Lissajous figure is proposed. This technology uses only one reference frequency source to realize the frequency standard comparison and frequency measurement between any frequency signals without frequency normalization. First, a new frequency standard comparison signal is obtained by using an adaptive frequency standard generation module to roughly measure the measured frequency. Second, the turning period is measured by observing the Lissajous figure. Third, via the turning period and the function relation of frequency deviation, the relative frequency difference between the measured and frequency standard signals can be obtained. Finally, the phase relation between the measured and frequency standard signals is determined by oscilloscope, and then the high-accuracy measurement of the measured frequency can be realized. The testing results indicate that the accuracy of the frequency measurement in the radiofrequency range can achieve the <inline-formula> <tex-math>$10^{-12}$ </tex-math></inline-formula> order of magnitude. Compared with the traditional frequency standard comparison technology, this technology has many characteristics, such as simple operation, low cost, low noise, and high measurement accuracy.","PeriodicalId":100630,"journal":{"name":"IEEE Open Journal of Instrumentation and Measurement","volume":"4 ","pages":"1-7"},"PeriodicalIF":0.0,"publicationDate":"2025-02-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10883668","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143396328","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2025-02-10DOI: 10.1109/OJIM.2025.3540122
Farzaneh Ahmadi;Reza Zoughi
This study presents the results of using a millimeter-wave reflectometer system, operating at 150 GHz, for demonstrating the basic efficacy of measuring electromagnetic scattering of metal powder used in laser powder bed fusion (LPBF) additive manufacturing (AM). Metal spatter (spatial) properties—particles ejected during laser interaction with metal powder—are potential indicators of process deviations (from a prescribed manner) or defect formation in a printed part. Electromagnetic modeling of scattering properties of metal powder has shown to be a potentially viable tool for assessing metal powder cloud spatial distribution and other properties. This work takes the next natural step by measuring the scattering properties of a cloud of metal powder. This investigation begins with samples of stationary powder, demonstrating a strong correlation between packing density and the measured output voltage of the reflectometer. The study progresses into detecting the flow of relatively large metal particles (i.e., solder balls) in air and measuring responses of flowing metal powder blown inside a nitrogen-filled chamber. Results crucially confirm that this method can distinguish a cloud of metal powder from the baseline condition where no powder is present. While promising, this investigation represents an initial step in the long journey toward optimizing millimeter-wave methods for integration into real-world LPBF AM systems.
{"title":"Microwave Reflectometry for Online Monitoring of Metal Powder Used in Laser Powder Bed Fusion Additive Manufacturing","authors":"Farzaneh Ahmadi;Reza Zoughi","doi":"10.1109/OJIM.2025.3540122","DOIUrl":"https://doi.org/10.1109/OJIM.2025.3540122","url":null,"abstract":"This study presents the results of using a millimeter-wave reflectometer system, operating at 150 GHz, for demonstrating the basic efficacy of measuring electromagnetic scattering of metal powder used in laser powder bed fusion (LPBF) additive manufacturing (AM). Metal spatter (spatial) properties—particles ejected during laser interaction with metal powder—are potential indicators of process deviations (from a prescribed manner) or defect formation in a printed part. Electromagnetic modeling of scattering properties of metal powder has shown to be a potentially viable tool for assessing metal powder cloud spatial distribution and other properties. This work takes the next natural step by measuring the scattering properties of a cloud of metal powder. This investigation begins with samples of stationary powder, demonstrating a strong correlation between packing density and the measured output voltage of the reflectometer. The study progresses into detecting the flow of relatively large metal particles (i.e., solder balls) in air and measuring responses of flowing metal powder blown inside a nitrogen-filled chamber. Results crucially confirm that this method can distinguish a cloud of metal powder from the baseline condition where no powder is present. While promising, this investigation represents an initial step in the long journey toward optimizing millimeter-wave methods for integration into real-world LPBF AM systems.","PeriodicalId":100630,"journal":{"name":"IEEE Open Journal of Instrumentation and Measurement","volume":"4 ","pages":"1-4"},"PeriodicalIF":0.0,"publicationDate":"2025-02-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10879018","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143521439","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2025-02-06DOI: 10.1109/OJIM.2025.3531742
reviewers
{"title":"OJIM 2024 Reviewer List","authors":"reviewers","doi":"10.1109/OJIM.2025.3531742","DOIUrl":"https://doi.org/10.1109/OJIM.2025.3531742","url":null,"abstract":"","PeriodicalId":100630,"journal":{"name":"IEEE Open Journal of Instrumentation and Measurement","volume":"4 ","pages":"1-4"},"PeriodicalIF":0.0,"publicationDate":"2025-02-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10877683","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143361072","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2025-01-15DOI: 10.1109/OJIM.2025.3530263
{"title":"2024 Index IEEE Open Journal of Instrumentation and Measurement Vol. 3","authors":"","doi":"10.1109/OJIM.2025.3530263","DOIUrl":"https://doi.org/10.1109/OJIM.2025.3530263","url":null,"abstract":"","PeriodicalId":100630,"journal":{"name":"IEEE Open Journal of Instrumentation and Measurement","volume":"3 ","pages":"1-10"},"PeriodicalIF":0.0,"publicationDate":"2025-01-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10843336","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143184173","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
The integration of radar sensing and imaging capabilities into future integrated sensing and communication (ISAC) networks enables advanced use cases, including autonomous vehicle navigation, real-time health monitoring, and smart city management. However, ultraprecise time and frequency synchronization is crucial for unlocking the full potential of such networked ISAC systems. In this article, a novel real-time wireless time and frequency synchronization scheme is developed and fully implemented on a high-end radio frequency system-on-chip field-programmable gate array (FPGA) platform. The excellent performance and robustness of the proposed solution in practical applications are demonstrated. It is evidenced that the recursive nature of the Kalman filter is well suited to the dynamic capabilities of FPGA-based simultaneous synchronization. Observed values obtained through the precision time protocol (PTP) are iteratively refined, thus effectively compensating for uncertainties encountered during a synchronization packet exchange. Due to the deterministic processing time inherent in the FPGA, the proposed synchronization method achieves exceptional precision, with clock offset deviations in the nanosecond range and clock rate deviations limited to only a few parts per billion, even across considerable distances between the network nodes.
{"title":"Ultrahigh-Performance Radio Frequency System-on-Chip Implementation of a Kalman Filter-Based High-Precision Time and Frequency Synchronization for Networked Integrated Sensing and Communication Systems","authors":"Roghayeh Ghasemi;Patrick Fenske;Tobias Koegel;Markus Hehn;Ingrid Ullmann;Martin Vossiek","doi":"10.1109/OJIM.2025.3527532","DOIUrl":"https://doi.org/10.1109/OJIM.2025.3527532","url":null,"abstract":"The integration of radar sensing and imaging capabilities into future integrated sensing and communication (ISAC) networks enables advanced use cases, including autonomous vehicle navigation, real-time health monitoring, and smart city management. However, ultraprecise time and frequency synchronization is crucial for unlocking the full potential of such networked ISAC systems. In this article, a novel real-time wireless time and frequency synchronization scheme is developed and fully implemented on a high-end radio frequency system-on-chip field-programmable gate array (FPGA) platform. The excellent performance and robustness of the proposed solution in practical applications are demonstrated. It is evidenced that the recursive nature of the Kalman filter is well suited to the dynamic capabilities of FPGA-based simultaneous synchronization. Observed values obtained through the precision time protocol (PTP) are iteratively refined, thus effectively compensating for uncertainties encountered during a synchronization packet exchange. Due to the deterministic processing time inherent in the FPGA, the proposed synchronization method achieves exceptional precision, with clock offset deviations in the nanosecond range and clock rate deviations limited to only a few parts per billion, even across considerable distances between the network nodes.","PeriodicalId":100630,"journal":{"name":"IEEE Open Journal of Instrumentation and Measurement","volume":"4 ","pages":"1-15"},"PeriodicalIF":0.0,"publicationDate":"2025-01-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10835166","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143106202","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2025-01-09DOI: 10.1109/OJIM.2025.3527529
Jose Moreira;Athanasios Papanikolaou;Jan Hesselbarth
This article discusses challenges and methods for production-level over-the-air (OTA) test of antenna-in-package (AiP) modules comprising antenna arrays operating at millimeter-wave frequencies. Starting with the requirements of testing specific properties of AiP modules, characteristics of far-field tests as well as different kinds of near-field tests are presented. Considering the constraints of typical automatic test equipment (ATE) used by the semiconductor industry, this article describes technical solutions for the integration of OTA testing into the ATE environment. Practical examples are discussed for testing AiP modules for 5G communication (frequency bands from 24 to 53 GHz). Limitations of the proposed techniques are detailed, and in view of future requirements for testing larger arrays at higher frequency, novel scalable approaches are presented for probing in the reactive near-field of the antenna array radiators.
{"title":"High-Volume OTA Production Testing of Millimeter-Wave Antenna-in-Package Modules","authors":"Jose Moreira;Athanasios Papanikolaou;Jan Hesselbarth","doi":"10.1109/OJIM.2025.3527529","DOIUrl":"https://doi.org/10.1109/OJIM.2025.3527529","url":null,"abstract":"This article discusses challenges and methods for production-level over-the-air (OTA) test of antenna-in-package (AiP) modules comprising antenna arrays operating at millimeter-wave frequencies. Starting with the requirements of testing specific properties of AiP modules, characteristics of far-field tests as well as different kinds of near-field tests are presented. Considering the constraints of typical automatic test equipment (ATE) used by the semiconductor industry, this article describes technical solutions for the integration of OTA testing into the ATE environment. Practical examples are discussed for testing AiP modules for 5G communication (frequency bands from 24 to 53 GHz). Limitations of the proposed techniques are detailed, and in view of future requirements for testing larger arrays at higher frequency, novel scalable approaches are presented for probing in the reactive near-field of the antenna array radiators.","PeriodicalId":100630,"journal":{"name":"IEEE Open Journal of Instrumentation and Measurement","volume":"4 ","pages":"1-15"},"PeriodicalIF":0.0,"publicationDate":"2025-01-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10835189","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143106205","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2024-12-27DOI: 10.1109/OJIM.2024.3522345
Omar Dhawahir;Murat Torlak
This article presents an innovative timing-based localization method aimed at determining the positions of active WiFi devices through passive reception. The method involves capturing and analyzing the timing of over-the-air WiFi packets: request-to-send (RTS), clear-to-send (CTS), data (DATA), and acknowledgment (ACK) packets exchanged between WiFi routers and clients. The accuracy of round-trip time (RTT) estimation, crucial for distance calculation, can be affected by factors, such as clock variations between devices and, notably, the short interframe space (SIFS) time setting in the WiFi protocol. Despite SIFS time aiming to ensure a consistent interval between DATA and ACK frame transmissions, IEEE 802.11 standards permit up to a 10% variation in SIFS time. When combined with device-level disparities and environmental fluctuations, individual RTT measurements may not reliably estimate distances. In this study, we employ statistical clustering techniques, specifically k-means clustering, to enhance RTT estimation by refining coarse- and fine-timing estimates. Each captured packet pair, i.e., (DATA/ACK), is assigned to the cluster with the most similar coarse and fine RTT characteristics. Subsequently, the properties of the identified cluster (e.g., coarse RTT/fine RTT) are utilized as a more precise RTT estimate for localization computations. Simulations and experiments conducted under diverse multipath conditions demonstrate the algorithm’s accuracy in 2-D positioning, achieving an average accuracy of as low as 0.24 m in simulations and 1.18 m in experiments when the Wi-Fi router and device are separated by distances of up to 18 m. The proposed method offers a robust approach for accurate passive Wi-Fi positioning, highlighting its potential for real-world applications.
{"title":"Enhancing Passive WiFi Device Localization Through Packet Timing Analysis","authors":"Omar Dhawahir;Murat Torlak","doi":"10.1109/OJIM.2024.3522345","DOIUrl":"https://doi.org/10.1109/OJIM.2024.3522345","url":null,"abstract":"This article presents an innovative timing-based localization method aimed at determining the positions of active WiFi devices through passive reception. The method involves capturing and analyzing the timing of over-the-air WiFi packets: request-to-send (RTS), clear-to-send (CTS), data (DATA), and acknowledgment (ACK) packets exchanged between WiFi routers and clients. The accuracy of round-trip time (RTT) estimation, crucial for distance calculation, can be affected by factors, such as clock variations between devices and, notably, the short interframe space (SIFS) time setting in the WiFi protocol. Despite SIFS time aiming to ensure a consistent interval between DATA and ACK frame transmissions, IEEE 802.11 standards permit up to a 10% variation in SIFS time. When combined with device-level disparities and environmental fluctuations, individual RTT measurements may not reliably estimate distances. In this study, we employ statistical clustering techniques, specifically k-means clustering, to enhance RTT estimation by refining coarse- and fine-timing estimates. Each captured packet pair, i.e., (DATA/ACK), is assigned to the cluster with the most similar coarse and fine RTT characteristics. Subsequently, the properties of the identified cluster (e.g., coarse RTT/fine RTT) are utilized as a more precise RTT estimate for localization computations. Simulations and experiments conducted under diverse multipath conditions demonstrate the algorithm’s accuracy in 2-D positioning, achieving an average accuracy of as low as 0.24 m in simulations and 1.18 m in experiments when the Wi-Fi router and device are separated by distances of up to 18 m. The proposed method offers a robust approach for accurate passive Wi-Fi positioning, highlighting its potential for real-world applications.","PeriodicalId":100630,"journal":{"name":"IEEE Open Journal of Instrumentation and Measurement","volume":"4 ","pages":"1-13"},"PeriodicalIF":0.0,"publicationDate":"2024-12-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10817509","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143106201","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2024-12-27DOI: 10.1109/OJIM.2024.3505992
{"title":"IEEE Instrumentation and Measurement Society","authors":"","doi":"10.1109/OJIM.2024.3505992","DOIUrl":"https://doi.org/10.1109/OJIM.2024.3505992","url":null,"abstract":"","PeriodicalId":100630,"journal":{"name":"IEEE Open Journal of Instrumentation and Measurement","volume":"3 ","pages":"C2-C2"},"PeriodicalIF":0.0,"publicationDate":"2024-12-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10817081","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142905878","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2024-12-27DOI: 10.1109/OJIM.2024.3505993
{"title":"IEEE Instrumentation and Measurement Society","authors":"","doi":"10.1109/OJIM.2024.3505993","DOIUrl":"https://doi.org/10.1109/OJIM.2024.3505993","url":null,"abstract":"","PeriodicalId":100630,"journal":{"name":"IEEE Open Journal of Instrumentation and Measurement","volume":"3 ","pages":"C3-C3"},"PeriodicalIF":0.0,"publicationDate":"2024-12-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10817082","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142905956","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2024-12-24DOI: 10.1109/OJIM.2024.3506272
James A. Smith;Helena Geirinhas Ramos
{"title":"Guest Editorial for Nondestructive Testing and Evaluation (NDT&E) Special Section","authors":"James A. Smith;Helena Geirinhas Ramos","doi":"10.1109/OJIM.2024.3506272","DOIUrl":"https://doi.org/10.1109/OJIM.2024.3506272","url":null,"abstract":"","PeriodicalId":100630,"journal":{"name":"IEEE Open Journal of Instrumentation and Measurement","volume":"3 ","pages":"1-3"},"PeriodicalIF":0.0,"publicationDate":"2024-12-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10815015","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142890153","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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