基于图注意网络的统一TCAD建模,通过迁移学习实现快速设计技术协同优化

IF 2.9 2区 工程技术 Q2 ENGINEERING, ELECTRICAL & ELECTRONIC IEEE Transactions on Electron Devices Pub Date : 2024-11-14 DOI:10.1109/TED.2024.3493854
Guangxi Fan;Tianliang Ma;Xuguang Sun;Leilai Shao;Kain Lu Low
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引用次数: 0

摘要

本文提出了一个创新框架,利用人工智能(AI)和图形表示法对 TCAD 器件仿真中的半导体器件进行编码。本文提出了一种基于图的通用编码方案,该方案结合了材料级和器件级嵌入,以及受有限元网格插值操作启发的新型空间关系嵌入。这种编码方法能无缝地适应 TCAD 模拟器的非结构网格特征,为器件表示提供了一种标准化方法,类似于将晶体管建模为图形,让人联想到计算机视觉(CV)和自然语言处理(NLP)中常用的统一表示法。该框架通过采用具有跳转连接的新型图注意网络(称为 RelGAT),实现了全面的数据驱动建模。该网络用于构建端到端代理模型,执行节点级电位仿真和图级电流电压(I-V)预测。此外,通过迁移学习,该框架被有效集成到基于碳纳米管(CNT)的新兴技术的设计技术协同优化(DTCO)流程中,从而促进了新工艺的早期评估并降低了计算成本。本文介绍了基于器件模拟器 Sentaurus TCAD 的全面技术细节,使研究人员能够在器件级采用所提出的人工智能驱动的电子设计自动化(EDA)解决方案。
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Graph Attention Network-Based Unified TCAD Modeling Enabling Fast Design Technology Co-Optimization Through Transfer Learning
An innovative framework that leverages artificial intelligence (AI) and graph representation for semiconductor device encoding in TCAD device simulation is proposed. A graph-based universal encoding scheme is presented that incorporates material-level and device-level embeddings, along with a novel spatial relationship embedding inspired by finite element meshing interpolation operations. This encoding approach seamlessly accommodates the unstructured mesh features of TCAD simulator, providing a standardized method for device representation, akin to modeling transistor as a graph, reminiscent of the unified representations commonly used in computer vision (CV) and natural language processing (NLP). The framework enables comprehensive data-driven modeling by employing a novel graph attention network with skip connections, referred to as RelGAT. This network is used to construct an end-to-end surrogate model, performing node-level potential emulation and graph-level current-voltage (I–V) prediction. Furthermore, this framework is effectively integrated into a design technology co-optimization (DTCO) flow for carbon nanotube (CNT)-based emerging technology through transfer learning, facilitating early-stage evaluations of new processes and reducing the computational cost. Comprehensive technical details based on the device simulator Sentaurus TCAD are presented, empowering researchers to adopt the proposed AI-driven electronic design automation (EDA) solution at the device level.
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来源期刊
IEEE Transactions on Electron Devices
IEEE Transactions on Electron Devices 工程技术-工程:电子与电气
CiteScore
5.80
自引率
16.10%
发文量
937
审稿时长
3.8 months
期刊介绍: IEEE Transactions on Electron Devices publishes original and significant contributions relating to the theory, modeling, design, performance and reliability of electron and ion integrated circuit devices and interconnects, involving insulators, metals, organic materials, micro-plasmas, semiconductors, quantum-effect structures, vacuum devices, and emerging materials with applications in bioelectronics, biomedical electronics, computation, communications, displays, microelectromechanics, imaging, micro-actuators, nanoelectronics, optoelectronics, photovoltaics, power ICs and micro-sensors. Tutorial and review papers on these subjects are also published and occasional special issues appear to present a collection of papers which treat particular areas in more depth and breadth.
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