热致发光掺钨氧化铟薄膜结构和电性能的调谐

IF 5.2 Q2 MATERIALS SCIENCE, MULTIDISCIPLINARY Materials Advances Pub Date : 2024-12-12 DOI:10.1039/D4MA00949E
Aparna C., Pramoda Kumara Shetty and Mahesha M. G.
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引用次数: 0

摘要

本文旨在合成掺钨氧化铟薄膜,并对其性能进行研究。采用喷雾热解技术制备了不同钨掺杂浓度的薄膜。利用拉曼光谱和x射线衍射对其结构特征进行了研究。证实了w掺杂氧化铟的多晶立方结构。掺杂观察到的形态变化支持了优选平面取向的变化。用紫外-可见光谱法研究了其光学性质。光致发光光谱显示近波段发射(NBE)和紫蓝色发射。热释光(TL)光谱证实了该材料在伽马传感应用中的适用性。从W的核心XPS光谱中得到的结合能对应于6+氧化态。钨掺杂后电阻率降低,这是由于供体电子增加所致。掺杂2 at% W的氧化铟具有良好的结构、光学和电学特性,使其适合用于传感器应用。
本文章由计算机程序翻译,如有差异,请以英文原文为准。

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Tuning of the structural and electrical properties of thermo-luminescent tungsten-doped indium oxide thin film

This paper aims to synthesize tungsten-doped indium oxide thin film and to study its properties. Films with different tungsten dopant concentrations were deposited using the technique of spray pyrolysis. Raman spectroscopy and X-ray diffraction were used to investigate the structural features. It confirms the polycrystalline cubic structure of W-doped indium oxide. The morphological change observed with doping supports the preferred plane orientation change. Optical properties were studied using UV-visible spectroscopy. The photoluminescence spectra showed both near-band emission (NBE) and violet-blue emission. The suitability of the material for gamma sensing applications was confirmed by thermoluminescence (TL) spectroscopy. The binding energy obtained from the core XPS spectra of W corresponds to a 6+ oxidation state. The electrical resistivity decreased with tungsten doping and it is attributed to the increase in donor electrons. Indium oxide doped with 2 at% W has good structural, optical, and electrical characteristics that make it suitable for use in sensor applications.

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来源期刊
Materials Advances
Materials Advances MATERIALS SCIENCE, MULTIDISCIPLINARY-
CiteScore
7.60
自引率
2.00%
发文量
665
审稿时长
5 weeks
期刊最新文献
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