基于28nm CMOS的70 mhz带宽时间交错噪声整形sar辅助Delta-Sigma数字交叉耦合ADC

Lucas Moura Santana;Ewout Martens;Jorge Lagos;Piet Wambacq;Jan Craninckx
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引用次数: 0

摘要

本研究提出了一种2倍时间交错(TI) δ - σ调制器(DSM)模数转换器(ADC),利用6-b噪声耦合(NC)噪声整形(NS) SAR量化器。提出了一种实现噪声耦合中量化的新技术,通过并行化耦合所需的操作来缓解时间瓶颈。环路滤波器采用节能、无保持相的环形放大器实现,并采用输入电容复位预采样,以减少输入网络中的反反馈噪声。整个ADC的采样率为1.4 GS/s,是迄今为止所有离散时间(DT) DSM ADC和TI NS ADC中最高的采样率之一,在70 mhz带宽下实现67/72 db SNDR/SNR,功耗为32 mW。
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A 70-MHz Bandwidth Time-Interleaved Noise-Shaping SAR-Assisted Delta-Sigma ADC With Digital Cross-Coupling in 28-nm CMOS
This work presents a $2\times $ time-interleaved (TI) delta-sigma modulator (DSM) analog-to-digital converter (ADC) leveraging a 6-b noise-coupled (NC) noise-shaping (NS) SAR quantizer. A novel technique to implement the noise coupling mid-quantization is presented to relax the timing bottleneck by parallelizing the operations needed for coupling. The loop filter is implemented using power-efficient, no hold-phase ring amplifiers, with an input capacitor reset presampling to reduce kickback noise in the input network. The complete ADC clocks at a sampling rate of 1.4 GS/s, which is one of the highest among all discrete-time (DT) DSM ADCs and TI NS ADCs to date, and achieves 67/72-dB SNDR/SNR over a 70-MHz bandwidth while consuming 32 mW.
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