一种基于多事件、7.9 ps分辨率时间放大的TDC和超低静态相位误差DLL,采用插值器循环技术用于dof应用

IF 5.6 1区 工程技术 Q1 ENGINEERING, ELECTRICAL & ELECTRONIC IEEE Journal of Solid-state Circuits Pub Date : 2025-01-09 DOI:10.1109/JSSC.2024.3525085
Xiayu Wang;Zhaoyang Zhou;Chunlin Li;Jin Hu;Dong Li;Yang Liu;Rui Ma;Zhangming Zhu
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摘要

本文提出了一种利用插值器循环技术实现高转换率的多事件时间-数字转换器(TDC)。在启动和停止信号的量化过程中,重用粗插值通道(CIC),大大减少了转换死区时间。高分辨率是通过粗-精插补与一个无需校准的高线性时间放大器(TA)来实现的。提出了一种采用全新的全对称量化(FSQ)方案的闪存子tdc,实现了精细插补,提高了线性度。为了提高TDC的精度和线性度,提出了一种带时间放大反馈回路的超低静态相位误差(SPE) DLL。所提出的TDC采用0.18- $\mu $ m CMOS技术制造,在2033.5 ns动态范围内实现7.9 ps分辨率,转换率为80 MS/s。最坏情况下DNL和INL分别为+0.15/ - 0.09 LSB和+0.69/ - 0.43 LSB。
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A Multi-Event, 7.9-ps Resolution Time Amplification-Based TDC With an Ultra-Low Static Phase Error DLL Using Interpolator Recycling Technique for dToF Applications
In this article, a multi-event time-to-digital converter (TDC) with a high conversion rate using an interpolator recycling technique is proposed. The conversion dead time is greatly reduced by reusing the coarse interpolation channel (CIC) during the quantization of Start and Stop signals. A high resolution is achieved by a coarse-fine interpolation with a calibration-free high-linearity time amplifier (TA). A flash sub-TDC using a novel fully symmetric quantization (FSQ) scheme is proposed to implement fine interpolation, which helps improve the linearity. An ultra-low static phase error (SPE) DLL with time amplification in the feedback loop is proposed, to improve the TDC’s precision and linearity. The proposed TDC is fabricated in a 0.18- $\mu $ m CMOS technology, achieving a 7.9-ps resolution over a 2033.5-ns dynamic range with a conversion rate of 80 MS/s. The worst case DNL and INL are +0.15/−0.09 LSB and +0.69/−0.43 LSB, respectively.
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来源期刊
IEEE Journal of Solid-state Circuits
IEEE Journal of Solid-state Circuits 工程技术-工程:电子与电气
CiteScore
11.00
自引率
20.40%
发文量
351
审稿时长
3-6 weeks
期刊介绍: The IEEE Journal of Solid-State Circuits publishes papers each month in the broad area of solid-state circuits with particular emphasis on transistor-level design of integrated circuits. It also provides coverage of topics such as circuits modeling, technology, systems design, layout, and testing that relate directly to IC design. Integrated circuits and VLSI are of principal interest; material related to discrete circuit design is seldom published. Experimental verification is strongly encouraged.
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