Lixun Wang;Yuejun Zhang;Pengjun Wang;Jianguo Yang;Huihong Zhang;Gang Li;Qikang Li
{"title":"基于578 tops /W rram的微型AI边缘设备二进制卷积神经网络宏","authors":"Lixun Wang;Yuejun Zhang;Pengjun Wang;Jianguo Yang;Huihong Zhang;Gang Li;Qikang Li","doi":"10.1109/TVLSI.2024.3469217","DOIUrl":null,"url":null,"abstract":"The novel nonvolatile computing-in-memory (nvCIM) technology enables data to be stored and processed in situ, providing a feasible solution for the widespread deployment of machine learning algorithms in edge AI devices. However, current nvCIM approaches based on weighted current summation face challenges such as device nonidealities and substantial time, storage, and energy overheads when handling high-precision analog signals. To address these issues, we propose a resistive random access memory (RRAM)-based binary convolution macro for constructing a complete binary convolutional neural network (BCNN) hardware circuit, accelerating edge AI applications with low-weight precision. This macro performs error compensation at the circuit level and provides stable rail-to-rail output, eliminating the need for any ADCs or processor to perform auxiliary computations. Experimental results demonstrate that the proposed BCNN full-hardware computing system achieves on-chip recognition accuracy of 90.7% (98.64%) on the CIFAR10 (MNIST) dataset, which represents a decrease of 0.98% (0.59%) compared to software recognition accuracy. In addition, this binary convolution macro achieves a maximum throughput of 320 GOPS and a peak energy efficiency of 578 TOPS/W at 136 MHz.","PeriodicalId":13425,"journal":{"name":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","volume":"33 2","pages":"371-383"},"PeriodicalIF":2.8000,"publicationDate":"2024-10-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"A 578-TOPS/W RRAM-Based Binary Convolutional Neural Network Macro for Tiny AI Edge Devices\",\"authors\":\"Lixun Wang;Yuejun Zhang;Pengjun Wang;Jianguo Yang;Huihong Zhang;Gang Li;Qikang Li\",\"doi\":\"10.1109/TVLSI.2024.3469217\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The novel nonvolatile computing-in-memory (nvCIM) technology enables data to be stored and processed in situ, providing a feasible solution for the widespread deployment of machine learning algorithms in edge AI devices. However, current nvCIM approaches based on weighted current summation face challenges such as device nonidealities and substantial time, storage, and energy overheads when handling high-precision analog signals. To address these issues, we propose a resistive random access memory (RRAM)-based binary convolution macro for constructing a complete binary convolutional neural network (BCNN) hardware circuit, accelerating edge AI applications with low-weight precision. This macro performs error compensation at the circuit level and provides stable rail-to-rail output, eliminating the need for any ADCs or processor to perform auxiliary computations. Experimental results demonstrate that the proposed BCNN full-hardware computing system achieves on-chip recognition accuracy of 90.7% (98.64%) on the CIFAR10 (MNIST) dataset, which represents a decrease of 0.98% (0.59%) compared to software recognition accuracy. In addition, this binary convolution macro achieves a maximum throughput of 320 GOPS and a peak energy efficiency of 578 TOPS/W at 136 MHz.\",\"PeriodicalId\":13425,\"journal\":{\"name\":\"IEEE Transactions on Very Large Scale Integration (VLSI) Systems\",\"volume\":\"33 2\",\"pages\":\"371-383\"},\"PeriodicalIF\":2.8000,\"publicationDate\":\"2024-10-08\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE Transactions on Very Large Scale Integration (VLSI) Systems\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://ieeexplore.ieee.org/document/10709360/\",\"RegionNum\":2,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q2\",\"JCRName\":\"COMPUTER SCIENCE, HARDWARE & ARCHITECTURE\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/10709360/","RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"COMPUTER SCIENCE, HARDWARE & ARCHITECTURE","Score":null,"Total":0}
A 578-TOPS/W RRAM-Based Binary Convolutional Neural Network Macro for Tiny AI Edge Devices
The novel nonvolatile computing-in-memory (nvCIM) technology enables data to be stored and processed in situ, providing a feasible solution for the widespread deployment of machine learning algorithms in edge AI devices. However, current nvCIM approaches based on weighted current summation face challenges such as device nonidealities and substantial time, storage, and energy overheads when handling high-precision analog signals. To address these issues, we propose a resistive random access memory (RRAM)-based binary convolution macro for constructing a complete binary convolutional neural network (BCNN) hardware circuit, accelerating edge AI applications with low-weight precision. This macro performs error compensation at the circuit level and provides stable rail-to-rail output, eliminating the need for any ADCs or processor to perform auxiliary computations. Experimental results demonstrate that the proposed BCNN full-hardware computing system achieves on-chip recognition accuracy of 90.7% (98.64%) on the CIFAR10 (MNIST) dataset, which represents a decrease of 0.98% (0.59%) compared to software recognition accuracy. In addition, this binary convolution macro achieves a maximum throughput of 320 GOPS and a peak energy efficiency of 578 TOPS/W at 136 MHz.
期刊介绍:
The IEEE Transactions on VLSI Systems is published as a monthly journal under the co-sponsorship of the IEEE Circuits and Systems Society, the IEEE Computer Society, and the IEEE Solid-State Circuits Society.
Design and realization of microelectronic systems using VLSI/ULSI technologies require close collaboration among scientists and engineers in the fields of systems architecture, logic and circuit design, chips and wafer fabrication, packaging, testing and systems applications. Generation of specifications, design and verification must be performed at all abstraction levels, including the system, register-transfer, logic, circuit, transistor and process levels.
To address this critical area through a common forum, the IEEE Transactions on VLSI Systems have been founded. The editorial board, consisting of international experts, invites original papers which emphasize and merit the novel systems integration aspects of microelectronic systems including interactions among systems design and partitioning, logic and memory design, digital and analog circuit design, layout synthesis, CAD tools, chips and wafer fabrication, testing and packaging, and systems level qualification. Thus, the coverage of these Transactions will focus on VLSI/ULSI microelectronic systems integration.