样品制备方法对反应焊接用溅射铝镍多层膜透射电镜研究的影响

IF 3.6 3区材料科学 Q2 MATERIALS SCIENCE, MULTIDISCIPLINARY Advanced Engineering Materials Pub Date : 2025-02-04 DOI:10.1002/adem.202570011

Juan Jesús Jiménez, Konrad Jaekel, Christoph Pauly, Christian Schäfer, Heike Bartsch, Frank Mücklich, Francisco Miguel Morales

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摘要

在文章编号2302215中，Juan Jesús jimsamnez和他的同事指出，制备方法对反应性多层膜中Al和Ni混合的透射电镜结果有至关重要的影响。三种薄片制备方法的比较表明，尽管Ga-FIB是一种较好的替代方案，但基于x的FIB污染较低。这一结果为研究纳米结构和粗糙表面上的自维持反应提供了一个重要的方面。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Impact of Sample Preparation Approach on Transmission Electron Microscopy Investigation of Sputtered AlNi Multilayers Used for Reactive Soldering

Sputtered AlNi Multilayers

In article number 2302215, Juan Jesús Jiménez and co-workers show that preparation methods have crucial influence on transmission electron microscopy results when investigating the intermixing between Al and Ni in reactive multilayers. The comparison of three lamella preparation methods shows that Xe-based FIB leads to low contamination, although Ga-FIB is a good alternative. This outcome presents an important aspect for the investigation of self-sustaining reactions on nanostructures and rough surfaces.

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来源期刊

Advanced Engineering Materials 工程技术-材料科学：综合

CiteScore

5.70

自引率

5.60%

发文量

544

审稿时长

1.7 months

期刊介绍： Advanced Engineering Materials is the membership journal of three leading European Materials Societies - German Materials Society/DGM, - French Materials Society/SF2M, - Swiss Materials Federation/SVMT.