Nikolay N. Davletshin , Andrey M. Vyunishev , Anatoly S. Chirkin
{"title":"鬼影成像显微镜:向三维扩展景深成像方向发展","authors":"Nikolay N. Davletshin , Andrey M. Vyunishev , Anatoly S. Chirkin","doi":"10.1016/j.optlastec.2025.112465","DOIUrl":null,"url":null,"abstract":"<div><div>Light-field microscopy techniques inherently suffer from image degradation outside the imaging system’s depth-of-field (DOF). Deviation from the correct imaging system’s focal plane resulted in a loss of resolution and distortion of image details. Here, we present a ghost imaging microscopy which is based on spatial intensity correlations of the light field. Ghost imaging microscopy allows us to overcome the limitations connected with the objective focusing tolerance leading to unprecedented high DOF. The obtained results promote the route to imaging volumetric microscopic structures up to several millimeters long.</div></div>","PeriodicalId":19511,"journal":{"name":"Optics and Laser Technology","volume":"184 ","pages":"Article 112465"},"PeriodicalIF":5.2000,"publicationDate":"2025-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Ghost imaging microscopy: Towards to three dimensional extended depth-of-field imaging\",\"authors\":\"Nikolay N. Davletshin , Andrey M. Vyunishev , Anatoly S. Chirkin\",\"doi\":\"10.1016/j.optlastec.2025.112465\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><div>Light-field microscopy techniques inherently suffer from image degradation outside the imaging system’s depth-of-field (DOF). Deviation from the correct imaging system’s focal plane resulted in a loss of resolution and distortion of image details. Here, we present a ghost imaging microscopy which is based on spatial intensity correlations of the light field. Ghost imaging microscopy allows us to overcome the limitations connected with the objective focusing tolerance leading to unprecedented high DOF. The obtained results promote the route to imaging volumetric microscopic structures up to several millimeters long.</div></div>\",\"PeriodicalId\":19511,\"journal\":{\"name\":\"Optics and Laser Technology\",\"volume\":\"184 \",\"pages\":\"Article 112465\"},\"PeriodicalIF\":5.2000,\"publicationDate\":\"2025-06-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Optics and Laser Technology\",\"FirstCategoryId\":\"101\",\"ListUrlMain\":\"https://www.sciencedirect.com/science/article/pii/S0030399225000532\",\"RegionNum\":2,\"RegionCategory\":\"物理与天体物理\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"2025/1/17 0:00:00\",\"PubModel\":\"Epub\",\"JCR\":\"Q1\",\"JCRName\":\"OPTICS\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Optics and Laser Technology","FirstCategoryId":"101","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0030399225000532","RegionNum":2,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"2025/1/17 0:00:00","PubModel":"Epub","JCR":"Q1","JCRName":"OPTICS","Score":null,"Total":0}
Ghost imaging microscopy: Towards to three dimensional extended depth-of-field imaging
Light-field microscopy techniques inherently suffer from image degradation outside the imaging system’s depth-of-field (DOF). Deviation from the correct imaging system’s focal plane resulted in a loss of resolution and distortion of image details. Here, we present a ghost imaging microscopy which is based on spatial intensity correlations of the light field. Ghost imaging microscopy allows us to overcome the limitations connected with the objective focusing tolerance leading to unprecedented high DOF. The obtained results promote the route to imaging volumetric microscopic structures up to several millimeters long.
期刊介绍:
Optics & Laser Technology aims to provide a vehicle for the publication of a broad range of high quality research and review papers in those fields of scientific and engineering research appertaining to the development and application of the technology of optics and lasers. Papers describing original work in these areas are submitted to rigorous refereeing prior to acceptance for publication.
The scope of Optics & Laser Technology encompasses, but is not restricted to, the following areas:
•development in all types of lasers
•developments in optoelectronic devices and photonics
•developments in new photonics and optical concepts
•developments in conventional optics, optical instruments and components
•techniques of optical metrology, including interferometry and optical fibre sensors
•LIDAR and other non-contact optical measurement techniques, including optical methods in heat and fluid flow
•applications of lasers to materials processing, optical NDT display (including holography) and optical communication
•research and development in the field of laser safety including studies of hazards resulting from the applications of lasers (laser safety, hazards of laser fume)
•developments in optical computing and optical information processing
•developments in new optical materials
•developments in new optical characterization methods and techniques
•developments in quantum optics
•developments in light assisted micro and nanofabrication methods and techniques
•developments in nanophotonics and biophotonics
•developments in imaging processing and systems