{"title":"AIIIBV T2SLs 红外探测器中由光电流引起的 1/f 噪声","authors":"Łukasz Ciura;Karol Dabrowski;Krystian Michalczewski;Łukasz Kubiszyn;Bartłomiej Seredyński;Waldemar Gawron;Kinga Majkowycz;Piotr Martyniuk","doi":"10.1109/LED.2024.3522363","DOIUrl":null,"url":null,"abstract":"This letter focuses on the 1/f noise induced by a photocurrent in infrared (IR) detectors based on the AIIIBV InAs/GaSb, and InAs/InAsSb type-II superlattices (T2SLs) optimized for mid-, or long-wavelength range. The relative photocurrent 1/f noise <inline-formula> <tex-math>$\\alpha _{\\textit {ph}}\\approx {3}\\times {10}^{-{11}}$ </tex-math></inline-formula> and <inline-formula> <tex-math>$\\alpha _{\\textit {ph}}\\approx {7}\\times {10}^{-{11}}$ </tex-math></inline-formula> were found for detectors based on InAs/GaSb and InAs/InAsSb T2SLs, respectively. It was shown that the dark current generates <inline-formula> <tex-math>$1/{f}$ </tex-math></inline-formula> noise much more efficiently than the photocurrent in all detectors. The lowest relative dark current 1/f noise <inline-formula> <tex-math>$\\alpha _{d}\\approx {4}\\times {10}^{-{8}}$ </tex-math></inline-formula> was obtained for interband cascade InAs/InAsSb T2SL detectors. The correlation between the photocurrent and the dark current 1/f noises was extracted, suggesting that both components partially origin the same source.","PeriodicalId":13198,"journal":{"name":"IEEE Electron Device Letters","volume":"46 2","pages":"155-158"},"PeriodicalIF":4.1000,"publicationDate":"2024-12-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Photocurrent-Induced 1/f Noise in AIIIBV T2SLs Infrared Detectors\",\"authors\":\"Łukasz Ciura;Karol Dabrowski;Krystian Michalczewski;Łukasz Kubiszyn;Bartłomiej Seredyński;Waldemar Gawron;Kinga Majkowycz;Piotr Martyniuk\",\"doi\":\"10.1109/LED.2024.3522363\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This letter focuses on the 1/f noise induced by a photocurrent in infrared (IR) detectors based on the AIIIBV InAs/GaSb, and InAs/InAsSb type-II superlattices (T2SLs) optimized for mid-, or long-wavelength range. The relative photocurrent 1/f noise <inline-formula> <tex-math>$\\\\alpha _{\\\\textit {ph}}\\\\approx {3}\\\\times {10}^{-{11}}$ </tex-math></inline-formula> and <inline-formula> <tex-math>$\\\\alpha _{\\\\textit {ph}}\\\\approx {7}\\\\times {10}^{-{11}}$ </tex-math></inline-formula> were found for detectors based on InAs/GaSb and InAs/InAsSb T2SLs, respectively. It was shown that the dark current generates <inline-formula> <tex-math>$1/{f}$ </tex-math></inline-formula> noise much more efficiently than the photocurrent in all detectors. The lowest relative dark current 1/f noise <inline-formula> <tex-math>$\\\\alpha _{d}\\\\approx {4}\\\\times {10}^{-{8}}$ </tex-math></inline-formula> was obtained for interband cascade InAs/InAsSb T2SL detectors. The correlation between the photocurrent and the dark current 1/f noises was extracted, suggesting that both components partially origin the same source.\",\"PeriodicalId\":13198,\"journal\":{\"name\":\"IEEE Electron Device Letters\",\"volume\":\"46 2\",\"pages\":\"155-158\"},\"PeriodicalIF\":4.1000,\"publicationDate\":\"2024-12-25\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE Electron Device Letters\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://ieeexplore.ieee.org/document/10816203/\",\"RegionNum\":2,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q2\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Electron Device Letters","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/10816203/","RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
Photocurrent-Induced 1/f Noise in AIIIBV T2SLs Infrared Detectors
This letter focuses on the 1/f noise induced by a photocurrent in infrared (IR) detectors based on the AIIIBV InAs/GaSb, and InAs/InAsSb type-II superlattices (T2SLs) optimized for mid-, or long-wavelength range. The relative photocurrent 1/f noise $\alpha _{\textit {ph}}\approx {3}\times {10}^{-{11}}$ and $\alpha _{\textit {ph}}\approx {7}\times {10}^{-{11}}$ were found for detectors based on InAs/GaSb and InAs/InAsSb T2SLs, respectively. It was shown that the dark current generates $1/{f}$ noise much more efficiently than the photocurrent in all detectors. The lowest relative dark current 1/f noise $\alpha _{d}\approx {4}\times {10}^{-{8}}$ was obtained for interband cascade InAs/InAsSb T2SL detectors. The correlation between the photocurrent and the dark current 1/f noises was extracted, suggesting that both components partially origin the same source.
期刊介绍:
IEEE Electron Device Letters publishes original and significant contributions relating to the theory, modeling, design, performance and reliability of electron and ion integrated circuit devices and interconnects, involving insulators, metals, organic materials, micro-plasmas, semiconductors, quantum-effect structures, vacuum devices, and emerging materials with applications in bioelectronics, biomedical electronics, computation, communications, displays, microelectromechanics, imaging, micro-actuators, nanoelectronics, optoelectronics, photovoltaics, power ICs and micro-sensors.