用暗场x射线显微镜测量位错的Burgers矢量

IF 2.7 3区 材料科学 Q2 CHEMISTRY, MULTIDISCIPLINARY Journal of Applied Crystallography Pub Date : 2025-01-30 DOI:10.1107/S1600576724011968
Dayeeta Pal, Yifan Wang, Ramya Gurunathan, Leora Dresselhaus-Marais
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摘要

位错的地下动力学对块状晶体材料的许多特性都是至关重要的。然而,由于电子的穿透深度有限,传统的透射电子显微镜(TEM)对块状晶体的表征具有挑战性。一种新的x射线成像技术——暗场x射线显微镜(DFXM)——被开发用于成像块状晶体中的分层位错结构。虽然目前的DFXM可以有效地绘制位错的线结构,但量化汉堡包矢量(控制位错行为的关键特征)仍然具有挑战性。我们将TEM理论中的“不可见准则”形式扩展到DFXM的几何光学模型中,并利用单边位错的多衍射峰成像证明了DFXM与暗场TEM之间的一致性。由于多峰DFXM实验的实际困难,我们进一步研究了如何将Burgers矢量效应编码到单峰DFXM实验中。利用几何光学DFXM仿真技术,研究了不同滚动倾角下摇摆倾斜扫描的不对称性,并提出了一种表征汉堡矢量的新方法。本研究的结论促进了我们对DFXM在表征个体位错方面的应用的理解,使大量DFXM成像与位错力学之间的联系成为可能。
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Measuring the Burgers vector of dislocations with dark-field X-ray microscopy

The subsurface dynamics of dislocations are essential to many properties of bulk crystalline materials. However, it is challenging to characterize a bulk crystal by conventional transmission electron microscopy (TEM) due to the limited penetration depth of electrons. A novel X-ray imaging technique – dark-field X-ray microscopy (DFXM) – was developed to image hierarchical dislocation structures in bulk crystals. While today's DFXM can effectively map the line structures of dislocations, it is still challenging to quantify the Burgers vectors, the key characterization governing the dislocation behaviors. We extend the `invisibility criterion' formalism from the TEM theory to the geometrical-optics model of DFXM and demonstrate the consistency between DFXM and dark-field TEM using multi-diffraction-peak imaging for a single edge dislocation. Due to the practical difficulty of multi-peak DFXM experiments, we further study how the Burgers vector effect is encoded for a single-peak DFXM experiment. Using the geometrical-optics DFXM simulation, we explore the asymmetry of rocking tilt scans at different rolling tilts and develop a new method to characterize the Burgers vector. The conclusions of this study advance our understanding of the use of DFXM in characterizing individual dislocations, enabling the connection from bulk DFXM imaging to dislocation mechanics.

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来源期刊
Journal of Applied Crystallography
Journal of Applied Crystallography CHEMISTRY, MULTIDISCIPLINARYCRYSTALLOGRAPH-CRYSTALLOGRAPHY
CiteScore
7.80
自引率
3.30%
发文量
178
期刊介绍: Many research topics in condensed matter research, materials science and the life sciences make use of crystallographic methods to study crystalline and non-crystalline matter with neutrons, X-rays and electrons. Articles published in the Journal of Applied Crystallography focus on these methods and their use in identifying structural and diffusion-controlled phase transformations, structure-property relationships, structural changes of defects, interfaces and surfaces, etc. Developments of instrumentation and crystallographic apparatus, theory and interpretation, numerical analysis and other related subjects are also covered. The journal is the primary place where crystallographic computer program information is published.
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