一种基于模数混合控制回路的宽带低噪声压控振荡器电路

IF 2.5 3区 工程技术 Q3 COMPUTER SCIENCE, HARDWARE & ARCHITECTURE Integration-The Vlsi Journal Pub Date : 2025-01-27 DOI:10.1016/j.vlsi.2025.102374
Lixia Zheng, Yuxiao Li, Zilu Zhao, Hehe Tian, Jin Wu, Weifeng Sun
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引用次数: 0

摘要

为了满足现代射频收发器对高性能宽带锁相环频率合成器的需求,本文设计了一种采用130 nm SiGe BiCMOS技术的宽带低噪声压控振荡器电路。VCO系统采用多核集成和开关电容阵列,集成了7个窄带VCO,实现全宽带频率覆盖。为了减轻压控振荡器输出摆幅随频率和PVT波动而加剧的相位噪声,设计了一种数模混合控制环进行动态摆幅校准。一种新的幅度控制模块利用电流镜像来稳定压控振荡器交叉耦合晶体管,取代尾电流源,提高校准精度并降低相位噪声。在锁相频率合成器芯片上对该VCO电路进行了室温测试,测试结果表明,VCO系统的调谐频率范围为7.22 ~ 15.12 GHz,压控增益绝对值小于200 MHz/V,频率偏差为1 MHz的14.5 GHz载波处的相位噪声为- 116.61 dBc/Hz。
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A broadband low-noise VCO circuit based on a hybrid analog-digital control loop
To meet the need for high-performance, broadband PLL frequency synthesizers in modern RF transceivers, this paper designs a broadband, low-noise VCO circuit using 130 nm SiGe BiCMOS technology. The VCO system employs multi-core integration and switched-capacitor arrays, integrating seven narrowband VCOs for full wideband frequency coverage. To mitigate phase noise exacerbated by VCO output swing fluctuations with frequency and PVT, a digital-analog hybrid control loop is designed for dynamic swing calibration. A novel amplitude control module utilizes current mirroring to stabilize VCO cross-coupled transistors, replacing tail current sources, enhancing calibration accuracy and reducing phase noise. The VCO circuit was tested on a lock-in frequency synthesizer chip at room temperature, and the test results show that the tuning frequency range of the VCO system is 7.22–15.12 GHz, the absolute value of the voltage-controlled gain is less than 200 MHz/V, and the phase noise at the 14.5 GHz carrier with 1 MHz frequency deviation is −116.61 dBc/Hz.
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来源期刊
Integration-The Vlsi Journal
Integration-The Vlsi Journal 工程技术-工程:电子与电气
CiteScore
3.80
自引率
5.30%
发文量
107
审稿时长
6 months
期刊介绍: Integration''s aim is to cover every aspect of the VLSI area, with an emphasis on cross-fertilization between various fields of science, and the design, verification, test and applications of integrated circuits and systems, as well as closely related topics in process and device technologies. Individual issues will feature peer-reviewed tutorials and articles as well as reviews of recent publications. The intended coverage of the journal can be assessed by examining the following (non-exclusive) list of topics: Specification methods and languages; Analog/Digital Integrated Circuits and Systems; VLSI architectures; Algorithms, methods and tools for modeling, simulation, synthesis and verification of integrated circuits and systems of any complexity; Embedded systems; High-level synthesis for VLSI systems; Logic synthesis and finite automata; Testing, design-for-test and test generation algorithms; Physical design; Formal verification; Algorithms implemented in VLSI systems; Systems engineering; Heterogeneous systems.
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