Thermistor and capacitor parameter analysis through electrical and dielectric investigations of manganite systems for technological applications

The present investigation highlights the impact of introducing few potassium contents on the electrical and dielectric properties of Pr_0.8Na_0.2MnO₃ mixed valence system. Resistivity curves of Pr_0.8Na_0.2-xK_xMnO₃ (x = 0.0 and x = 0.05) manganites have been investigated over a large temperature range between 80 K and 500 K. The studied compounds exhibit a semiconductor behavior. Between 180 K and 400 K, the activation energy values E_a, the thermistor constant β, the sensitivity factor α, and the stability factor SF parameters are calculated to confirm that Pr_0.8Na_0.2-xK_xMnO₃ (x = 0.0 and x = 0.05) compounds are suitable candidates for sensor applications. Capacitance measurements as a function of frequency, at various temperatures, are reported for both samples to confirm the strong importance of the microstructure (bulk and grain boundary regions) on the dielectric properties and the capacitive behavior of the manganites. From the capacitance investigation, we found that both prepared ceramics are charactered by motivating and stable capacitance values making those compounds promote applicant in the sector of the ceramic capacitors with Y5R, Y6R, Y7R, and X7P codes.