Biao Dong , Yuangang Lu , Jian Huang , Jiahao Zha , Hongwei Wang , Chongjun He
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Third-order nonlinear optical behavior and optical limiting properties of thulium-doped zinc tungstate crystal
Thulium-doped zinc tungstate (ZnWO4: Tm) crystal is an important functional material, which has potential applications in the field of laser technology. However, the third-order nonlinear optical behavior and nonlinear optical limiting (NOL) properties of ZnWO4: Tm crystal have rarely been investigated. In this study, we have successfully grown ZnWO4 crystal doped with Tm3+ using the Czochralski method. We have measured the absorption, Raman, and X-ray diffraction spectra of the crystal, with absorption peaks corresponding to the energy transitions of Tm3+. Utilizing Z-scan technique at the wavelength of 1064 nm, we have determined the nonlinear absorption coefficients arising from two-photon absorption, the nonlinear refraction coefficients stemming from electronic Kerr effect, and the third-order nonlinear coefficients for the crystal. Furthermore, we have evaluated the NOL performance of the crystal by measuring its transmittance at three different thicknesses of 2, 4, and 6 mm. At the thickness of 6 mm, the crystal exhibits a maximum transmittance of 89.1% at low input fluence and a minimum transmittance of 54.2% at high input fluence. These experimental results suggest that the novel ZnWO4: Tm crystal holds potential as a promising new material for NOL at 1064 nm.
期刊介绍:
Optical Materials has an open access mirror journal Optical Materials: X, sharing the same aims and scope, editorial team, submission system and rigorous peer review.
The purpose of Optical Materials is to provide a means of communication and technology transfer between researchers who are interested in materials for potential device applications. The journal publishes original papers and review articles on the design, synthesis, characterisation and applications of optical materials.
OPTICAL MATERIALS focuses on:
• Optical Properties of Material Systems;
• The Materials Aspects of Optical Phenomena;
• The Materials Aspects of Devices and Applications.
Authors can submit separate research elements describing their data to Data in Brief and methods to Methods X.