{"title":"面向智能机械故障诊断的不平衡部分传输网络","authors":"Chuancang Ding;Yanlin Zhou;Xuyan Liu;Baoxiang Wang;Weiguo Huang;Zhongkui Zhu","doi":"10.1109/TIM.2025.3542138","DOIUrl":null,"url":null,"abstract":"Transfer learning (TL) has garnered significant interest in mechanical fault diagnosis. Many current TL approaches typically assume that ample data are available and that both the source and target domains possess identical label spaces. However, these TL methods often fail to address real-world issues, particularly when the number of samples in different conditions is unequal (i.e., imbalance) and the target label space is a subset of the source label space [i.e., partial transfer learning (PTL)]. To address these issues, this study proposes the imbalanced partial transfer network (IPTN). The IPTN introduces a weighted maximum density divergence (MDD) loss and a discriminative sample generator (DSG). The DSG identifies distinctive samples in the target domain and expands the dataset by augmenting these distinctive samples to solve the sample imbalance problem. Meanwhile, the new loss function termed weighted MDD promotes the ability of PTL by increasing interclass distance and intraclass density. Experiments on two datasets demonstrate the superior diagnostic performance of the IPTN compared to several comparison methods, highlighting its powerful transfer capability in situations involving sample imbalance and PTL.","PeriodicalId":13341,"journal":{"name":"IEEE Transactions on Instrumentation and Measurement","volume":"74 ","pages":"1-11"},"PeriodicalIF":5.9000,"publicationDate":"2025-02-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Imbalanced Partial Transfer Network for Intelligent Machine Fault Diagnosis\",\"authors\":\"Chuancang Ding;Yanlin Zhou;Xuyan Liu;Baoxiang Wang;Weiguo Huang;Zhongkui Zhu\",\"doi\":\"10.1109/TIM.2025.3542138\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Transfer learning (TL) has garnered significant interest in mechanical fault diagnosis. Many current TL approaches typically assume that ample data are available and that both the source and target domains possess identical label spaces. However, these TL methods often fail to address real-world issues, particularly when the number of samples in different conditions is unequal (i.e., imbalance) and the target label space is a subset of the source label space [i.e., partial transfer learning (PTL)]. To address these issues, this study proposes the imbalanced partial transfer network (IPTN). The IPTN introduces a weighted maximum density divergence (MDD) loss and a discriminative sample generator (DSG). The DSG identifies distinctive samples in the target domain and expands the dataset by augmenting these distinctive samples to solve the sample imbalance problem. Meanwhile, the new loss function termed weighted MDD promotes the ability of PTL by increasing interclass distance and intraclass density. Experiments on two datasets demonstrate the superior diagnostic performance of the IPTN compared to several comparison methods, highlighting its powerful transfer capability in situations involving sample imbalance and PTL.\",\"PeriodicalId\":13341,\"journal\":{\"name\":\"IEEE Transactions on Instrumentation and Measurement\",\"volume\":\"74 \",\"pages\":\"1-11\"},\"PeriodicalIF\":5.9000,\"publicationDate\":\"2025-02-17\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE Transactions on Instrumentation and Measurement\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://ieeexplore.ieee.org/document/10891388/\",\"RegionNum\":2,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q1\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Instrumentation and Measurement","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/10891388/","RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
Imbalanced Partial Transfer Network for Intelligent Machine Fault Diagnosis
Transfer learning (TL) has garnered significant interest in mechanical fault diagnosis. Many current TL approaches typically assume that ample data are available and that both the source and target domains possess identical label spaces. However, these TL methods often fail to address real-world issues, particularly when the number of samples in different conditions is unequal (i.e., imbalance) and the target label space is a subset of the source label space [i.e., partial transfer learning (PTL)]. To address these issues, this study proposes the imbalanced partial transfer network (IPTN). The IPTN introduces a weighted maximum density divergence (MDD) loss and a discriminative sample generator (DSG). The DSG identifies distinctive samples in the target domain and expands the dataset by augmenting these distinctive samples to solve the sample imbalance problem. Meanwhile, the new loss function termed weighted MDD promotes the ability of PTL by increasing interclass distance and intraclass density. Experiments on two datasets demonstrate the superior diagnostic performance of the IPTN compared to several comparison methods, highlighting its powerful transfer capability in situations involving sample imbalance and PTL.
期刊介绍:
Papers are sought that address innovative solutions to the development and use of electrical and electronic instruments and equipment to measure, monitor and/or record physical phenomena for the purpose of advancing measurement science, methods, functionality and applications. The scope of these papers may encompass: (1) theory, methodology, and practice of measurement; (2) design, development and evaluation of instrumentation and measurement systems and components used in generating, acquiring, conditioning and processing signals; (3) analysis, representation, display, and preservation of the information obtained from a set of measurements; and (4) scientific and technical support to establishment and maintenance of technical standards in the field of Instrumentation and Measurement.