使用扭曲标记绘制数量性状基因座图谱。

International journal of plant genomics Pub Date : 2009-01-01 Epub Date: 2010-02-21 DOI:10.1155/2009/410825
Shizhong Xu, Zhiqiu Hu
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摘要

定量性状基因座(QTL)绘图通常使用遵循孟德尔分离比的标记。我们开发了一种新的 QTL 图谱绘制方法,可以使用具有分离畸变的标记(非孟德尔标记)。我们使用 EM(期望最大化)算法来估计 QTL 和 SDL(分离畸变位点)参数。QTL 和 SDL 的联合分析对选择性基因分型特别有用。我们利用小麦 QTL 图谱实验的实际数据演示了联合分析的应用。
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Mapping quantitative trait Loci using distorted markers.

Quantitative trait locus (QTL) mapping is usually performed using markers that follow a Mendelian segregation ratio. We developed a new method of QTL mapping that can use markers with segregation distortion (non-Mendelian markers). An EM (expectation-maximization) algorithm is used to estimate QTL and SDL (segregation distortion loci) parameters. The joint analysis of QTL and SDL is particularly useful for selective genotyping. Application of the joint analysis is demonstrated using a real life data from a wheat QTL mapping experiment.

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