由自组织映射解释的自回归过程。应用于工业过程异常行为的检测。

IEEE transactions on neural networks Pub Date : 2011-12-01 Epub Date: 2011-10-10 DOI:10.1109/TNN.2011.2169810
Chiara Brighenti, Miguel Á Sanz-Bobi
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引用次数: 22

摘要

本文利用自组织映射(SOM)分析了自回归过程的期望时间演化。它研究了SOM如何捕获AR输入过程给出的时间信息,以及如何在概率角度下理解从一个神经元到另一个神经元的转换。特别是,地图上的AR过程预计会移动到的区域被确定。这种特性允许检测AR工艺结构或参数中的异常变化。在此基础上,提出了一种异常检测方法,并将其应用于实际工业过程中。
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Auto-regressive processes explained by self-organized maps. Application to the detection of abnormal behavior in industrial processes.

This paper analyzes the expected time evolution of an auto-regressive (AR) process using self-organized maps (SOM). It investigates how a SOM captures the time information given by the AR input process and how the transitions from one neuron to another one can be understood under a probabilistic perspective. In particular, regions of the map into which the AR process is expected to move are identified. This characterization allows detecting anomalous changes in the AR process structure or parameters. On the basis of the theoretical results, an anomaly detection method is proposed and applied to a real industrial process.

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来源期刊
IEEE transactions on neural networks
IEEE transactions on neural networks 工程技术-工程:电子与电气
自引率
0.00%
发文量
2
审稿时长
8.7 months
期刊最新文献
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