S Levcenko, R Biller, T Pfeiffelmann, K Ritter, H H Falk, T Wang, S Siebentritt, E Welter, C S Schnohr
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引用次数: 0
摘要
本文介绍了一种新设计的装置，用于在 PETRA III 的光束线 P65 上执行稳态 X 射线激发光学发光（XEOL）光谱以及同时 XEOL 和 X 射线吸收光谱表征。XEOL 装置配备了氦流低温恒温器和最先进的光学检测系统，波长范围宽达 300-1700 nm，光谱分辨率高达 0.4 nm。为了演示该装置的功能，对多晶 CuInSe2 薄膜、单晶 GaN 薄膜和单晶 ZnO 块状半导体样品进行了低温 XEOL 研究。
High-resolution XEOL spectroscopy setup at the X-ray absorption spectroscopy beamline P65 of PETRA III.
A newly designed setup to perform steady-state X-ray excited optical luminescence (XEOL) spectroscopy and simultaneous XEOL and X-ray absorption spectroscopy characterization at beamline P65 of PETRA III is described. The XEOL setup is equipped with a He-flow cryostat and state-of-the-art optical detection system, which covers a wide wavelength range of 300-1700 nm with a high spectral resolution of 0.4 nm. To demonstrate the setup functioning, low-temperature XEOL studies on polycrystalline CuInSe2 thin film, single-crystalline GaN thin film and single-crystalline ZnO bulk semiconductor samples are performed.
期刊介绍：
Synchrotron radiation research is rapidly expanding with many new sources of radiation being created globally. Synchrotron radiation plays a leading role in pure science and in emerging technologies. The Journal of Synchrotron Radiation provides comprehensive coverage of the entire field of synchrotron radiation and free-electron laser research including instrumentation, theory, computing and scientific applications in areas such as biology, nanoscience and materials science. Rapid publication ensures an up-to-date information resource for scientists and engineers in the field.
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