E Nazaretski, D S Coburn, W Xu, J Ma, H Xu, R Smith, X Huang, Y Yang, L Huang, M Idir, A Kiss, Y S Chu
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引用次数: 0
摘要
报告了安装在 NSLS-II 的 5-ID 亚微米分辨率 X 射线光谱（SRX）光束线的新型扫描显微镜的开发、建造和首次调试结果。开发的系统利用 Kirkpatrick-Baez 镜进行 X 射线聚焦。该仪器可进行空间分辨率低于 200 nm 的二维和三维光谱测量。本文重点介绍了样品扫描阶段的设计方面、光学考虑因素和具体细节，并总结了一些初步调试结果。
A new Kirkpatrick-Baez-based scanning microscope for the Submicron Resolution X-ray Spectroscopy (SRX) beamline at NSLS-II.
The development, construction, and first commissioning results of a new scanning microscope installed at the 5-ID Submicron Resolution X-ray Spectroscopy (SRX) beamline at NSLS-II are reported. The developed system utilizes Kirkpatrick-Baez mirrors for X-ray focusing. The instrument is designed to enable spectromicroscopy measurements in 2D and 3D with sub-200 nm spatial resolution. The present paper focuses on the design aspects, optical considerations, and specifics of the sample scanning stage, summarizing some of the initial commissioning results.
期刊介绍：
Synchrotron radiation research is rapidly expanding with many new sources of radiation being created globally. Synchrotron radiation plays a leading role in pure science and in emerging technologies. The Journal of Synchrotron Radiation provides comprehensive coverage of the entire field of synchrotron radiation and free-electron laser research including instrumentation, theory, computing and scientific applications in areas such as biology, nanoscience and materials science. Rapid publication ensures an up-to-date information resource for scientists and engineers in the field.
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