{"title":"利用光学荧光测量氧化铝中的应力:重温。","authors":"Robert F Cook, Chris A Michaels","doi":"10.6028/jres.124.020","DOIUrl":null,"url":null,"abstract":"<p><p>Stress measurements in single-crystal and polycrystalline alumina are revisited using a recently developed optical fluorescence energy shift method. The method simultaneously utilizes the R<sub>1</sub> and R<sub>2</sub> Cr-related ruby line shifts in alumina to determine two components of the stress tensor in crystallographic coordinates, independent of the intended or assumed stress state. Measurements from a range of experimental conditions, including high-pressure, shock, quasi-static, and bulk polycrystals containing thermal expansion anisotropy effects, are analyzed. In many cases, the new analysis suggests stress states and stress magnitudes significantly different from those inferred previously, particularly for shock experiments. An implication is that atomistic models relating stress state to fluorescence shift require significant refinement for use in materials-based residual stress distribution analyses. Conversely, the earliest measurements of fluorescence in polycrystalline alumina are shown to be consistent with recent detailed measurements of stress equilibrium and dispersion.</p>","PeriodicalId":54766,"journal":{"name":"Journal of Research of the National Institute of Standards and Technology","volume":"124 ","pages":"1-15"},"PeriodicalIF":1.3000,"publicationDate":"2019-08-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7340554/pdf/jres-124-020.pdf","citationCount":"0","resultStr":"{\"title\":\"Stress Measurements in Alumina by Optical Fluorescence: Revisited.\",\"authors\":\"Robert F Cook, Chris A Michaels\",\"doi\":\"10.6028/jres.124.020\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<p><p>Stress measurements in single-crystal and polycrystalline alumina are revisited using a recently developed optical fluorescence energy shift method. The method simultaneously utilizes the R<sub>1</sub> and R<sub>2</sub> Cr-related ruby line shifts in alumina to determine two components of the stress tensor in crystallographic coordinates, independent of the intended or assumed stress state. Measurements from a range of experimental conditions, including high-pressure, shock, quasi-static, and bulk polycrystals containing thermal expansion anisotropy effects, are analyzed. In many cases, the new analysis suggests stress states and stress magnitudes significantly different from those inferred previously, particularly for shock experiments. An implication is that atomistic models relating stress state to fluorescence shift require significant refinement for use in materials-based residual stress distribution analyses. Conversely, the earliest measurements of fluorescence in polycrystalline alumina are shown to be consistent with recent detailed measurements of stress equilibrium and dispersion.</p>\",\"PeriodicalId\":54766,\"journal\":{\"name\":\"Journal of Research of the National Institute of Standards and Technology\",\"volume\":\"124 \",\"pages\":\"1-15\"},\"PeriodicalIF\":1.3000,\"publicationDate\":\"2019-08-27\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7340554/pdf/jres-124-020.pdf\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Journal of Research of the National Institute of Standards and Technology\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://doi.org/10.6028/jres.124.020\",\"RegionNum\":4,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"2019/1/1 0:00:00\",\"PubModel\":\"eCollection\",\"JCR\":\"Q3\",\"JCRName\":\"INSTRUMENTS & INSTRUMENTATION\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Research of the National Institute of Standards and Technology","FirstCategoryId":"5","ListUrlMain":"https://doi.org/10.6028/jres.124.020","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"2019/1/1 0:00:00","PubModel":"eCollection","JCR":"Q3","JCRName":"INSTRUMENTS & INSTRUMENTATION","Score":null,"Total":0}
Stress Measurements in Alumina by Optical Fluorescence: Revisited.
Stress measurements in single-crystal and polycrystalline alumina are revisited using a recently developed optical fluorescence energy shift method. The method simultaneously utilizes the R1 and R2 Cr-related ruby line shifts in alumina to determine two components of the stress tensor in crystallographic coordinates, independent of the intended or assumed stress state. Measurements from a range of experimental conditions, including high-pressure, shock, quasi-static, and bulk polycrystals containing thermal expansion anisotropy effects, are analyzed. In many cases, the new analysis suggests stress states and stress magnitudes significantly different from those inferred previously, particularly for shock experiments. An implication is that atomistic models relating stress state to fluorescence shift require significant refinement for use in materials-based residual stress distribution analyses. Conversely, the earliest measurements of fluorescence in polycrystalline alumina are shown to be consistent with recent detailed measurements of stress equilibrium and dispersion.
期刊介绍:
The Journal of Research of the National Institute of Standards and Technology is the flagship publication of the National Institute of Standards and Technology. It has been published under various titles and forms since 1904, with its roots as Scientific Papers issued as the Bulletin of the Bureau of Standards.
In 1928, the Scientific Papers were combined with Technologic Papers, which reported results of investigations of material and methods of testing. This new publication was titled the Bureau of Standards Journal of Research.
The Journal of Research of NIST reports NIST research and development in metrology and related fields of physical science, engineering, applied mathematics, statistics, biotechnology, information technology.