Bala Muralikrishnan, Meghan Shilling, Steve Phillips, Wei Ren, Vincent Lee, Felix Kim
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引用次数: 0
摘要
美国机械工程师学会 (ASME) 和国际标准化组织 (ISO) 的工作委员会正在制定 X 射线计算机断层扫描 (XCT) 仪器性能评估标准。制定文件标准的一个主要挑战是确定对已知误差源敏感的测试程序。在这项工作的第一部分,我们描述了与探测器相关的几何误差的影响,并通过模拟确定了它们对位于断层重建测量体积内的球体的球心到球心距离误差和球体形状误差的影响。我们还介绍了一种新的模拟方法--单点射线追踪法,以有效地进行距离和形状误差计算,并提供了验证该方法的数据。在第二部分中,我们同样以模拟研究为基础,描述了与旋转阶段相关的误差对位于断层重建测量体积中的球体的中心到中心距离误差和球体形状误差的影响。我们推荐了对旋转台误差最敏感的最佳球心位置,供文献标准委员会在制定性能评估测试程序时参考。
X-ray Computed Tomography Instrument Performance Evaluation, Part II: Sensitivity to Rotation Stage Errors.
The development of standards for evaluating the performance of X-ray computed tomography (XCT) instruments is ongoing within the American Society of Mechanical Engineers (ASME) and the International Organization for Standardization (ISO) working committees. A key challenge in developing documentary standards is to identify test procedures that are sensitive to known error sources. In Part I of this work, we described the effect of geometry errors associated with the detector and determined their influence through simulations on sphere center-to-center distance errors and sphere form errors for spheres located in the tomographically reconstructed measurement volume. We also introduced a new simulation method, the single-point ray tracing method, to efficiently perform the distance and form error computations and presented data validating the method. In this second part, also based on simulation studies, we describe the effect of errors associated with the rotation stage on sphere center-to-center distance errors and sphere form errors for spheres located in the tomographically reconstructed measurement volume. We recommend optimal sphere center locations that are most sensitive to rotation stage errors for consideration by documentary standards committees in the development of test procedures for performance evaluation.
期刊介绍:
The Journal of Research of the National Institute of Standards and Technology is the flagship publication of the National Institute of Standards and Technology. It has been published under various titles and forms since 1904, with its roots as Scientific Papers issued as the Bulletin of the Bureau of Standards.
In 1928, the Scientific Papers were combined with Technologic Papers, which reported results of investigations of material and methods of testing. This new publication was titled the Bureau of Standards Journal of Research.
The Journal of Research of NIST reports NIST research and development in metrology and related fields of physical science, engineering, applied mathematics, statistics, biotechnology, information technology.